IEICE Technical Report

Online edition: ISSN 2432-6380

Volume 124, Number 243

Superconductive Electronics

Workshop Date : 2024-11-08 - 2024-11-09 / Issue Date : 2024-11-01

[PREV] [NEXT]

[TOP] | [2018] | [2019] | [2020] | [2021] | [2022] | [2023] | [2024] | [Japanese] / [English]

[PROGRAM] [BULK PDF DOWNLOAD]


Table of contents

SCE2024-4
A Study on Substrate Noise Reduction of STJ Detectors Using Buffer Layers
Yu Nakamura, Go Fujii (AIST), Tsuyoshi Noguchi (Saitama Univ.), Shigetomo Shiki (AIST), Tohru Taino (Saitama Univ.)
pp. 1 - 3

SCE2024-5
Improving Sensitivity of Lumped Element Kinetic Inductance Detectors using TiN Thin Film
Yuto Masuoka, Masato Naruse, Hiroaki Myoren (Saitama Univ.)
pp. 4 - 8

SCE2024-6
Design method of optical cavities for superconducting nanowire single-photon detectors based on microwave engineering
Hiroki Kutsuma, Taro Yamashita (TohokuU)
pp. 9 - 12

SCE2024-7
Superconducting single-photon detectors using epitaxial NbN(111) thin film on sapphire substrate
Kentaro Morinaga, hiroki Kutsuma (Tohoku Univ.), Michitaka Wakebayashi, Atsushi Kobayashi (Tokyo Univ. of Science), Taro Yamashita (Tohoku Univ.)
pp. 13 - 16

SCE2024-8
2-μm wator vapor lidar with superconducting nanostrip single-photon detectors
Makoto Aoki, Hironori Iwai, Seiji Kawamura (NICT), Fumihiro China (AIST), Shigehito Miki, Hirotaka Terai, Toshikazu Itabe (NICT)
pp. 17 - 20

SCE2024-9
A study on the speed enhancement of a transition edge sensor-based photon number resolving detector
Yuki Mitsuya, Masahiro Iijima, Ryutaro Matsumoto, Hiroyuki Takahashi (UTokyo)
pp. 21 - 22

SCE2024-10
Evaluation of detection efficiency and dark count rate of NbTiN superconducting single-photon detectors with various linewidths
Tomohiro Haneishi (Tohoku Univ.), Masahiro Yabuno (NICT), Hiroki Kutsuma (Tohoku Univ.), Shigehito Miki (NICT), Taro Yamashita (Tohoku Univ.)
pp. 23 - 26

SCE2024-11
Microfabrication of iron-based superconductor NdFeAs(O,H) thin films for applications as superconducting nanowire single photon detectors
Takafumi Hatano, Atsuro Yoshikawa, Shunya Tomioka, Ibuki Washitani, Koki Miyamoto, Daichi Aoki, Hiroshi Ikuta (Nagoya Univ.)
pp. 27 - 31

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan