Online edition: ISSN 2432-6380
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EMCJ2024-70
A Feasibility of Self-Interference Suppression Method in Echo TEMPEST Using Frequency Conversion
Ryo Nagoshi, Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST)
pp. 1 - 4
EMCJ2024-71
Analysis of Lossy Side-Channel Waveform in Electromagnetic Information Leakage
Hideaki Sone (Tohoku Univ.), Yuichi Hayashi (NAIST)
pp. 5 - 7
EMCJ2024-72
SNR Identification Using Fewer Plaintexts Selected to Save Evaluation Time of Side-Channel Attack Success Rate
Masaki Himuro, Rei Mitsuyasu, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.)
pp. 8 - 9
EMCJ2024-73
Study on evaluation and analysis method of electromagnetic noise reduction effect of IC chip by magnetic materials
Sosuke Ashida (Kobe Univ.), Koh Watanabe (NICT), Hiraku Uehara, Satoshi Tanaka, Makoto Nagata (Kobe Univ.), Masahiro Yamaguchi (Tohoku Univ.)
pp. 10 - 13
EMCJ2024-74
Measurement of Magnetic shielding Effectiveness Using Two Coaxially-Aligned Loops for Multilayer Planar Shields and Its Stratification Effect
Yamato Nakamukai, Atsuhiro Nishikata (Science Tokyo)
pp. 14 - 19
EMCJ2024-75
Numerical Assessment of Temperature Increase Due to Implanted Metal Plates from Magnetic Coupling Wireless Power Transfer System in 6 MHz Band
Shuhei Waki, Funa Tsumura, Takashi Hikage (Hokkaido Univ.), Tomoaki Nagaoka (NICT)
pp. 20 - 22
EMCJ2024-76
Numerical Estimation of Specific Absorption Rates for 5G Smartphones Using Child and Adolescent Phantom Models
Minori Kagohashi, Takashi Hikage, Toshihiko Nishimura (Hokkaido Univ.), Tatsuya Kashiwa (KIT), Keiko Yamazaki, Naomi Tamura, Reiko Kishi (Hokkaido Univ.)
pp. 23 - 26
EMCJ2024-77
Electromagnetic Field Exposure Monitoring on Commercial 5G FR2 Base Stations in the Urban Area of Tokyo
Sen Liu, Kazuhiro Tobita, Teruo Onishi, Masao Taki, Soichi Watanabe (NICT)
pp. 27 - 28
EMCJ2024-78
Electromagnetic Interference Issues of Aircraft Radio Altimeters Due to Adjacent Sub-6 band 5G Mobile Systems in Japan
Shunichi Futatsumori (ENRI)
pp. 29 - 34
EMCJ2024-79
[Invited Talk]
Introduction to Activities of EMC-related Societies in Japan and EMC research at Okayama University
Yoshitaka Toyota (Okayama Univ.)
pp. 35 - 40
EMCJ2024-80
2D Poynting Vector Measurement on the Substrate Surface Using an Electromagnetic Field Probe and RF Transceiver
Yuhei Takeshita, Isao Iwase, Makoto Tanaka, Takanori Uno (DENSO)
pp. 41 - 44
EMCJ2024-81
Calibration of Millimeter-Wave Broadband Antenna Using Optical Modulator
Jerdvisanop Chakarothai, Katsumi Fujii, Maya Mizuno (NICT)
pp. 45 - 49
EMCJ2024-82
The Correlation between Electromagnetic Noise Characteristics and the Increase of GPS Misoperation 2
Hiraku Uehara (Kobe Univ.), Koh Watanabe (NICT), Sosuke Ashida, Yushi Mitsuya, Satoshi Tanaka, Makoto Nagata (Kobe Univ.)
pp. 50 - 53
EMCJ2024-83
Analysis of Impact on High-speed Mobile Communication by Electromagnetic Noise from Industrial Unmanned Aerial Vehicles
Koh Watanabe (NICT), Hiraku Uehara, Satoshi Tanaka, Makoto Nagata (Kobe Univ.), Ifong Wu, Yasushi Matsumoto, Kaoru Gotoh (NICT)
pp. 54 - 58
EMCJ2024-84
Group Delay Optimal Design of Noncommensurate Transmission Line With Degree of Freedom in Gaps Between C-sections
Wakana Kashima, Yoshiki Kayano, Taiki Yamagiwa, Fengchao Xiao (UEC)
pp. 59 - 62
EMCJ2024-85
Design of Bend Differential-Paired Lines With Both Enhancement of Signal Integrity and Suppression of Common-Mode Noise Using Topology Optimization
Hayato Komatsu, Yoshiki Kayano, Fengchao Xiao (UEC)
pp. 63 - 68
EMCJ2024-86
Study on Dependency of Crosstalk on Distance between Two Pairs of Differential-Paired Lines with Common Mode Choke Coil
Hayato Komiya, Yoshiki Kayano, Yoshio Kami, Fengchao Xiao (UEC), Sayaka Sekiguchi, Hiroya Ueyama, Naoki Iida (Murata Manufacturing Co.,Ltd)
pp. 69 - 73
EMCJ2024-87
Common-mode Noise Canceller for GaN Traction Inverter
Takashi Sawada, Satoshi Ogasawara, Hiroshi Tadano, Koji Shiozaki (Nagoya Univ.)
pp. 74 - 79
EMCJ2024-88
Correlation between Number of Characteristic Modes of Stirrers and Field Uniformity of Reverberation Chambers
Kodai Yaguchi, Takahiro Aoyagi (Science Tokyo)
pp. 80 - 81
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.