IEICE Technical Report

Online edition: ISSN 2432-6380

Reliability

Workshop Date : 2025-09-25 / Issue Date : 2025-09-18

R2025-32
Evaluation of confidence interval constructed using the modified Wald statistic
Yuto Yamamoto, Ueki Masao (Nagasaki Univ.)
pp. 1 - 3

R2025-33
AUC Maximization in Binary Classification Models and Its Robustness Evaluation
Taichi Sakuma, Tetsuji Ohyama (Kurume Univ.), Takeshi Emura (Hiroshima Univ.)
pp. 4 - 6

R2025-34
A note on sports injury prediction model for sumo wrestlers with dependent censoring by retirement
Shuhei Ota (Kanagawa Univ.), Mitsuhiro Kimura (Hosei Univ.)
pp. 7 - 11

R2025-35
Methodology for Multiple Imputation in Survival Analysis -- Compatibility between the Substantive and Imputation Models --
Masato Iwami, Frukawa Kyoji (Kurume Univ), Takeshi Emura (Hiroshima Univ)
pp. 12 - 15

R2025-36
A Basic Study of Factor Analysis under Dependent Termination -- Framework for survival time analysis using copulas and exponential distributions --
Rikuto Takatani, Takeshi Emura (Hiroshima Univ.)
pp. 16 - 30

R2025-37
Joint Frailty-Copula Model for Simultaneous Analysis of Overall Survival and Progression-Free Survival in Lung Adenocarcinoma
Ayano Kajitani, Takeahi Emura (Hiroshima)
pp. 31 - 37

R2025-38
A Note on EM Estimation for Bernstein Copula with Binned Data
Hiroyuki Okamura, Junjun Zheng, Tadashi Dohi (Hiroshima Univ.)
pp. 38 - 41

R2025-39

Kota Izumi (Kitasato Univ.), Takeshi Emura (Hiroshima Univ.), Hirofumi Michimae (Kitasato Univ.)
pp. 42 - 47

R2025-40
Estimating mixture ratio for the mixture distribution -- Toward applications to the stochastic timed automata --
Nanami Taketomi (Nagasaki Univ.)
pp. 48 - 51

R2025-41
On new metrics IAP and IRP for binary classification tests without a gold standard
Tetsuji Ohyama (Kurume Univ.)
pp. 52 - 56

R2025-42
[Invited Talk] Prediction intervals and their application to reliability with statistical models
Masao Ueki (Nagasaki Univ.)
pp. 57 - 60

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan