IEICE Technical Report

Online edition: ISSN 2432-6380

Silicon Device and Materials

Workshop Date : 2026-10-15 - 2026-10-16 / Issue Date : 2026-10-08

SDM2026-33
[Invited Talk] Mathematical modelings and analysis for reconnection between semiconductor electron devices and fluctuation
Seiya Kasai (Hokkaido Univ.)
pp. 1 - 4

SDM2026-34
Analysis of Within-Wafer Distribution of Polyimide Curing Process Using a Single-Wafer Annealing Tool
Haruki Ito, Takuma Seki, Keiichi Hashimoto, Takezo Mawaki, Rihito Kuroda (Tohoku univ)
pp. 5 - 8

SDM2026-35
Influence of Si Substrate Orientation on Ultra-thin Silicide Formation for Schottky-Barrier MFSFET
Hongqian Deng, Haoran Yan, Haolin Wang, Yusuke Tsuchiya, Kangbai Li, Shun-ichiro Ohmi (Science Tokyo)
pp. 9 - 12

SDM2026-36
[Invited Talk] Formation of Lattice-in-Dot : High-Density Formation and Room-Temperature Photoluminescence Characterization of Fe-Silicide Nanolayer-Embedded Si Quantum Dots
Katsunori Makihara (Nagoya Univ.)
pp. 13 - 18

SDM2026-37
Thermal oxidation dependence on Si substrate orientation and evaluation of interface properties
Koki Yamamoto, Shun-ichiro Ohmi (Science Tokyo), Ken Hayakawa, Haruo Sudo, Koji Izunome (GWJ)
pp. 19 - 22

SDM2026-38
Fabrication of a 3D-Stacked 2-Stage LOFIC CMOS Image Sensor Using Pixel-Wise Electrical Connections
Takezo Mawaki, Masaya Yoshida, Kohei Takizawa, Rihito Kuroda (Tohoku Univ.)
pp. 23 - 26

SDM2026-39
Statistical Capacitance Measurement Using 3D Stacked Array Test Circuit and Extension to Characterization of Next-Generation Memory Materials
Ryoya Nishimaki, Kaito Shinjo, Takezo Mawaki, Rihito Kuroda (Tohoku Univ.)
pp. 27 - 30

SDM2026-40
[Invited Talk] Study of Area Selective Deposition utilizing Surface Adsorption Selectivity
Shuji Azumo, Sena Fujita, Haruka Okoshi, Shinichi Ike, Genki Hayashi, Tomohiro Nakagawa, Tetsuya Goto (TEL)
pp. 31 - 35

SDM2026-41
Performance Improvement of Normally-Off IGZO TFTs by Low-Level Nitrogen Doping
Toru Kanazawa, Masahisa Watanabe (TTS), Satoshi Kojima (TEL), Akira Shimizu, Tetsuya Goto (TTS)
pp. 36 - 41

SDM2026-42
[Invited Talk] From Ferroelectric and Piezoelectric Materials to LiDAR Sensing and Autonomous Mobile Robots
Fuminobu Imaizumi (NIT, Oyama College)
pp. 42 - 45

SDM2026-43
[Memorial Lecture] Property Engineering of Polycrystalline Ge Thin Films for Diverse Device Applications -- Transistors, Thermoelectric Energy Conversion, and Lithium-Ion Batteries --
Koki Nozawa, Takashi Suemasu, Kaoru Toko (Univ. of Tsukuba)
p. 46

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan