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Paper Abstract and Keywords
Presentation 2006-05-12 14:00
Measurement and Analysis of Delay and Power Variations in 90nm CMOS Circuits
Masaki Yamaguchi (Kyushu Univ.), Yang Yuan (Xi'an Univ. of Technology), Kosuke Tarumi, Ryota Sakamoto, Masanori Muroyama, Tohru Ishihara, Hiroto Yasuura (Kyushu Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) As the transistor size shrinks, process variations increase. Under the existence of the variations, an existing design flow will not be effective for minimizing the worst-case circuit delay and average power consumption. As the first step toward developing a better solution, this paper investigates basic characteristics of the delay and the power variation. We measured delay and power consumption values for 1,890 ring oscillator circuits designed with 90nm CMOS technology. We also analyzed both intra-chip and inter-chip variations for delay, dynamic power consumption and leakage power consumption. The measurement results demonstrated that the leakage power variation is very large and the inter-chip variations are larger than the intra-chip variations.
Keyword (in Japanese) (See Japanese page) 
(in English) delay variation / power variation / Deep Sub-Micron / CMOS / / / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 32, VLD2006-13, pp. 41-46, May 2006.
Paper # VLD2006-13 
Date of Issue 2006-05-05 (VLD) 
ISSN Print edition: ISSN 0913-5685
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Conference Information
Committee VLD IPSJ-SLDM  
Conference Date 2006-05-11 - 2006-05-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Ehime University 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To VLD 
Conference Code 2006-05-VLD-IPSJ-SLDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Measurement and Analysis of Delay and Power Variations in 90nm CMOS Circuits 
Sub Title (in English)  
Keyword(1) delay variation  
Keyword(2) power variation  
Keyword(3) Deep Sub-Micron  
Keyword(4) CMOS  
Keyword(5)  
Keyword(6)  
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1st Author's Name Masaki Yamaguchi  
1st Author's Affiliation Kyushu University (Kyushu Univ.)
2nd Author's Name Yang Yuan  
2nd Author's Affiliation Xi'an University of Technology (Xi'an Univ. of Technology)
3rd Author's Name Kosuke Tarumi  
3rd Author's Affiliation Kyushu University (Kyushu Univ.)
4th Author's Name Ryota Sakamoto  
4th Author's Affiliation Kyushu University (Kyushu Univ.)
5th Author's Name Masanori Muroyama  
5th Author's Affiliation Kyushu University (Kyushu Univ.)
6th Author's Name Tohru Ishihara  
6th Author's Affiliation Kyushu University (Kyushu Univ.)
7th Author's Name Hiroto Yasuura  
7th Author's Affiliation Kyushu University (Kyushu Univ.)
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Speaker Author-1 
Date Time 2006-05-12 14:00:00 
Presentation Time 30 minutes 
Registration for VLD 
Paper # VLD2006-13 
Volume (vol) vol.106 
Number (no) no.32 
Page pp.41-46 
#Pages 6 
Date of Issue 2006-05-05 (VLD) 

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