| Paper Abstract and Keywords |
| Presentation |
2006-06-08 15:30
Design for Testability of Software-Based Self-Test for Processors
Masato Nakazato, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara (NAIST) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
In this paper, we propose a design for testability method for test programs of software-based self-test using test program templates. Software-based self-test using templates has a problem of error masking where some faults detected in a test generation for a module are not detected by the test program synthesized from
the test.
The proposed method achieves 100% template level fault efficiency in a sense that the proposed method completely resolves the problem of error masking. Moreover, the proposed method adds only observation points
to the original design, it enables at-speed testing and does not induce delay overhead. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
software-based self-test / design for testability / processor / error mask / test program template / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 106, no. 92, ICD2006-48, pp. 49-54, June 2006. |
| Paper # |
ICD2006-48 |
| Date of Issue |
2006-06-01 (ICD) |
| ISSN |
Print edition: ISSN 0913-5685 |
| Download PDF |
|
| Conference Information |
| Committee |
ICD IPSJ-ARC |
| Conference Date |
2006-06-08 - 2006-06-09 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
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| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
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| Paper Information |
| Registration To |
ICD |
| Conference Code |
2006-06-ICD-IPSJ-ARC |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Design for Testability of Software-Based Self-Test for Processors |
| Sub Title (in English) |
|
| Keyword(1) |
software-based self-test |
| Keyword(2) |
design for testability |
| Keyword(3) |
processor |
| Keyword(4) |
error mask |
| Keyword(5) |
test program template |
| Keyword(6) |
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| Keyword(7) |
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| Keyword(8) |
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| 1st Author's Name |
Masato Nakazato |
| 1st Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
| 2nd Author's Name |
Satoshi Ohtake |
| 2nd Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
| 3rd Author's Name |
Michiko Inoue |
| 3rd Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
| 4th Author's Name |
Hideo Fujiwara |
| 4th Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
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| Speaker |
Author-1 |
| Date Time |
2006-06-08 15:30:00 |
| Presentation Time |
30 minutes |
| Registration for |
ICD |
| Paper # |
ICD2006-48 |
| Volume (vol) |
vol.106 |
| Number (no) |
no.92 |
| Page |
pp.49-54 |
| #Pages |
6 |
| Date of Issue |
2006-06-01 (ICD) |