Paper Abstract and Keywords |
Presentation |
2006-06-08 15:30
Design for Testability of Software-Based Self-Test for Processors Masato Nakazato, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara (NAIST) Link to ES Tech. Rep. Archives: ICD2006-48 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this paper, we propose a design for testability method for test programs of software-based self-test using test program templates. Software-based self-test using templates has a problem of error masking where some faults detected in a test generation for a module are not detected by the test program synthesized from
the test.
The proposed method achieves 100% template level fault efficiency in a sense that the proposed method completely resolves the problem of error masking. Moreover, the proposed method adds only observation points
to the original design, it enables at-speed testing and does not induce delay overhead. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
software-based self-test / design for testability / processor / error mask / test program template / / / |
Reference Info. |
IEICE Tech. Rep., vol. 106, no. 92, ICD2006-48, pp. 49-54, June 2006. |
Paper # |
ICD2006-48 |
Date of Issue |
2006-06-01 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
Link to ES Tech. Rep. Archives: ICD2006-48 |
Conference Information |
Committee |
ICD IPSJ-ARC |
Conference Date |
2006-06-08 - 2006-06-09 |
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(See Japanese page) |
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Paper Information |
Registration To |
ICD |
Conference Code |
2006-06-ICD-IPSJ-ARC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Design for Testability of Software-Based Self-Test for Processors |
Sub Title (in English) |
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Keyword(1) |
software-based self-test |
Keyword(2) |
design for testability |
Keyword(3) |
processor |
Keyword(4) |
error mask |
Keyword(5) |
test program template |
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1st Author's Name |
Masato Nakazato |
1st Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
2nd Author's Name |
Satoshi Ohtake |
2nd Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
3rd Author's Name |
Michiko Inoue |
3rd Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
4th Author's Name |
Hideo Fujiwara |
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Nara Institute of Science and Technology (NAIST) |
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Speaker |
Author-1 |
Date Time |
2006-06-08 15:30:00 |
Presentation Time |
30 minutes |
Registration for |
ICD |
Paper # |
ICD2006-48 |
Volume (vol) |
vol.106 |
Number (no) |
no.92 |
Page |
pp.49-54 |
#Pages |
6 |
Date of Issue |
2006-06-01 (ICD) |