Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2006-07-13 15:40
Failure Analysis and Simulation of Electrical Power System for Satellite
Go Segami, Hiroaki Kusawake, Yasuhiro Shimizu, Koichi Kibe (JAXA) EE2006-15
Abstract (in Japanese) (See Japanese page) 
(in English) Fault tolerant desigen is necessary for satellite because we can’t repair anything in space if there is something wrong with the satellite. Even if the satellite has the trouble, we have to minimize damage and carry out missions. Therefore we perform enough tests and simulations on the ground and improve reliability by reflecting the results of the design. In this paper, we discuss failure analysis of short circuit and disconnection fault which are the failure modes of the electrical power system for the satellite.
Keyword (in Japanese) (See Japanese page) 
(in English) Power System for Satellite / Open Failure / Harness / Fuse / Transient Response / / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 152, EE2006-15, pp. 35-39, July 2006.
Paper # EE2006-15 
Date of Issue 2006-07-06 (EE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EE2006-15

Conference Information
Committee EE  
Conference Date 2006-07-13 - 2006-07-14 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EE 
Conference Code 2006-07-EE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Failure Analysis and Simulation of Electrical Power System for Satellite 
Sub Title (in English)  
Keyword(1) Power System for Satellite  
Keyword(2) Open Failure  
Keyword(3) Harness  
Keyword(4) Fuse  
Keyword(5) Transient Response  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Go Segami  
1st Author's Affiliation Japan AerospaceExploration Agency (JAXA)
2nd Author's Name Hiroaki Kusawake  
2nd Author's Affiliation Japan AerospaceExploration Agency (JAXA)
3rd Author's Name Yasuhiro Shimizu  
3rd Author's Affiliation Japan AerospaceExploration Agency (JAXA)
4th Author's Name Koichi Kibe  
4th Author's Affiliation Japan AerospaceExploration Agency (JAXA)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2006-07-13 15:40:00 
Presentation Time 30 minutes 
Registration for EE 
Paper # EE2006-15 
Volume (vol) vol.106 
Number (no) no.152 
Page pp.35-39 
#Pages 5 
Date of Issue 2006-07-06 (EE) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan