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Paper Abstract and Keywords
Presentation 2006-07-27 10:20
Determination of impedances in LECCS-I/O model by 3-port VNA measurement for higher frequency range
Akihiro Osaki, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga (Okayama Univ.), Osami Wada (Kyoto Univ.) EMCJ2006-21
Abstract (in Japanese) (See Japanese page) 
(in English) This report discusses impedance determination of a linear equivalent circuit (LEC) in an EMC macro model, LECCS I/O. The 2-port LECCS I/O model the authors had proposed based on 2-port measurement by a vector network analyzer (VNA) was found to be affected by an external circuit connected to the input terminals of CMOS gates. To remove the defect, this report investigated a 3-port LECCS I/O modelwith 3-port VNA. The
3-port model includes the input circuit of CMOS gates and the three ports of the model mean the power-supply terminal, the output terminal, and the input terminal to the ground terminal. The proposed 3-port model with 3-port VNA was used for power-ground impedance simulation by changing the impedances of external input and output circuits. As a result, the impedance simulation was in good agreement with measurements higher frequency range compared with the previous 2-port model with 2-port VNA.
Keyword (in Japanese) (See Japanese page) 
(in English) Broadband / EMC macro-model / LECCS-I/O model / 3-port VNA measurement / Parameter determination / Power-GND impedance / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 182, EMCJ2006-21, pp. 17-22, July 2006.
Paper # EMCJ2006-21 
Date of Issue 2006-07-20 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2006-07-27 - 2006-07-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2006-07-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Determination of impedances in LECCS-I/O model by 3-port VNA measurement for higher frequency range 
Sub Title (in English)  
Keyword(1) Broadband  
Keyword(2) EMC macro-model  
Keyword(3) LECCS-I/O model  
Keyword(4) 3-port VNA measurement  
Keyword(5) Parameter determination  
Keyword(6) Power-GND impedance  
Keyword(7)  
Keyword(8)  
1st Author's Name Akihiro Osaki  
1st Author's Affiliation Okayama University (Okayama Univ.)
2nd Author's Name Kengo Iokibe  
2nd Author's Affiliation Okayama University (Okayama Univ.)
3rd Author's Name Yoshitaka Toyota  
3rd Author's Affiliation Okayama University (Okayama Univ.)
4th Author's Name Ryuji Koga  
4th Author's Affiliation Okayama University (Okayama Univ.)
5th Author's Name Osami Wada  
5th Author's Affiliation Kyoto University (Kyoto Univ.)
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Speaker Author-1 
Date Time 2006-07-27 10:20:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2006-21 
Volume (vol) vol.106 
Number (no) no.182 
Page pp.17-22 
#Pages 6 
Date of Issue 2006-07-20 (EMCJ) 

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