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Paper Abstract and Keywords
Presentation 2006-08-24 16:25
Durability of Optical Connectors with Scratched End-Face
Ryo Nagase (NTT), Masao Inoue (Hirose Electric), Junji Taira (Seikoh Giken), Masato Shiino (Furukawa Electric)
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
(in English) / / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 212, EMD2006-34, pp. 49-53, Aug. 2006.
Paper # EMD2006-34 
Date of Issue 2006-08-17 (EMD, CPM, OPE, LQE) 
ISSN Print edition: ISSN 0913-5685
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Conference Information
Committee EMD CPM LQE OPE  
Conference Date 2006-08-24 - 2006-08-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Chitose Arcadia Plaza 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2006-08-EMD-CPM-LQE-OPE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Durability of Optical Connectors with Scratched End-Face 
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1st Author's Name Ryo Nagase  
1st Author's Affiliation NTT (NTT)
2nd Author's Name Masao Inoue  
2nd Author's Affiliation Hirose Electric Co., Ltd. (Hirose Electric)
3rd Author's Name Junji Taira  
3rd Author's Affiliation Seikoh Giken Co., Ltd. (Seikoh Giken)
4th Author's Name Masato Shiino  
4th Author's Affiliation Furukawa Electric Co., Ltd. (Furukawa Electric)
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Speaker Author-1 
Date Time 2006-08-24 16:25:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2006-34, CPM2006-64, OPE2006-76, LQE2006-41 
Volume (vol) vol.106 
Number (no) no.212(EMD), no.213(CPM), no.214(OPE), no.215(LQE) 
Page pp.49-53 
#Pages 5 
Date of Issue 2006-08-17 (EMD, CPM, OPE, LQE) 

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