| Paper Abstract and Keywords |
| Presentation |
2006-10-05 16:10
Temperature Distribution Analysis of AlGaN/GaN HFETs Operated at High Voltage Using Micro-Raman Spectroscopy Kenichi Kosaka, Tatsuya Hujishima (Ritsumeikan Univ.), Kaoru Inoue (FED), Akihiro Hinoki (Ritsumeikan Univ.), Tomoaki Yamada, Tadayoshi Tsuchiya, Junjiroh Kikawa, Shinichi Kamiya (FED), Akira Suzuki (Ritsumeikan Univ./FED), Tsutomu Araki, Yasushi Nanishi (Ritsumeikan Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
(Not available yet) |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
/ / / / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 106, no. 269, ED2006-159, pp. 39-43, Oct. 2006. |
| Paper # |
ED2006-159 |
| Date of Issue |
2006-09-28 (ED, CPM, LQE) |
| ISSN |
Print edition: ISSN 0913-5685 |
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