| Paper Abstract and Keywords |
| Presentation |
2006-10-27 10:30
Design Method of System LSI with Three-Dimensional Transistor (FinFET)
-- Reduction of pattern Area -- Shigeyoshi Watanabe, Keisuke Okamoto, Makoto Oya (SIT) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
New design method of system LSI with FinFET has been developed. Using planar+FinFET architecture the pattern area of system LSI designed by cell library can be reduced to about 30% compared with the conventional planar case. New design method is a promising candidate for realizing future high performance, high-density system LSI. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
system LSI / FinFET / channel width / sidewall channel width / cell library / TIS / / |
| Reference Info. |
IEICE Tech. Rep., vol. 106, no. 317, ICD2006-131, pp. 25-30, Oct. 2006. |
| Paper # |
ICD2006-131 |
| Date of Issue |
2006-10-20 (SIP, ICD, IE) |
| ISSN |
Print edition: ISSN 0913-5685 |
| Download PDF |
|
| Conference Information |
| Committee |
ICD SIP IE IPSJ-SLDM |
| Conference Date |
2006-10-26 - 2006-10-27 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
|
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
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| Paper Information |
| Registration To |
ICD |
| Conference Code |
2006-10-ICD-SIP-IE-IPSJ-SLDM |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Design Method of System LSI with Three-Dimensional Transistor (FinFET) |
| Sub Title (in English) |
Reduction of pattern Area |
| Keyword(1) |
system LSI |
| Keyword(2) |
FinFET |
| Keyword(3) |
channel width |
| Keyword(4) |
sidewall channel width |
| Keyword(5) |
cell library |
| Keyword(6) |
TIS |
| Keyword(7) |
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| Keyword(8) |
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| 1st Author's Name |
Shigeyoshi Watanabe |
| 1st Author's Affiliation |
Shonan Institute of Technology (SIT) |
| 2nd Author's Name |
Keisuke Okamoto |
| 2nd Author's Affiliation |
Shonan Institute of Technology (SIT) |
| 3rd Author's Name |
Makoto Oya |
| 3rd Author's Affiliation |
Shonan Institute of Technology (SIT) |
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| Speaker |
Author-1 |
| Date Time |
2006-10-27 10:30:00 |
| Presentation Time |
20 minutes |
| Registration for |
ICD |
| Paper # |
SIP2006-105, ICD2006-131, IE2006-83 |
| Volume (vol) |
vol.106 |
| Number (no) |
no.315(SIP), no.317(ICD), no.319(IE) |
| Page |
pp.25-30 |
| #Pages |
6 |
| Date of Issue |
2006-10-20 (SIP, ICD, IE) |