| Paper Abstract and Keywords |
| Presentation |
2007-01-18 10:15
Measurement of Delay Degradation Due to Power Supply Noise and Delay Variation Estimation with Full-Chip Simulation
Yasuhiro Ogasahara, Takashi Enami, Masanori Hashimoto (Osaka Univ.), Takashi Sato (Tokyo Inst. Tech.), Takao Onoye (Osaka Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
Power integrity is an crucial design issue in nano-meter technologies because of lowered supply voltage and current increase. This paper focuses on gate delay variation due to power/ground noise, and demonstrates measurement results in a 90nm technology. For full-chip simulation, a current model with capacitance and variable resistor is developed to accurately model current dependency on voltage drop. Measurement results are well correlated with simulation, and verify that gate delay depends on average voltage drop. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
power supply noise / full-chip simulation / transistor model / delay estimation / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 106, no. 468, ICD2006-174, pp. 19-23, Jan. 2007. |
| Paper # |
ICD2006-174 |
| Date of Issue |
2007-01-11 (CPM, ICD) |
| ISSN |
Print edition: ISSN 0913-5685 |
| Download PDF |
|
| Conference Information |
| Committee |
ICD CPM |
| Conference Date |
2007-01-18 - 2007-01-19 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Kika-Shinko-Kaikan Bldg. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
LSI system assembly and module/inteface technology, test, general |
| Paper Information |
| Registration To |
ICD |
| Conference Code |
2007-01-ICD-CPM |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Measurement of Delay Degradation Due to Power Supply Noise and Delay Variation Estimation with Full-Chip Simulation |
| Sub Title (in English) |
|
| Keyword(1) |
power supply noise |
| Keyword(2) |
full-chip simulation |
| Keyword(3) |
transistor model |
| Keyword(4) |
delay estimation |
| Keyword(5) |
|
| Keyword(6) |
|
| Keyword(7) |
|
| Keyword(8) |
|
| 1st Author's Name |
Yasuhiro Ogasahara |
| 1st Author's Affiliation |
Osaka University (Osaka Univ.) |
| 2nd Author's Name |
Takashi Enami |
| 2nd Author's Affiliation |
Osaka University (Osaka Univ.) |
| 3rd Author's Name |
Masanori Hashimoto |
| 3rd Author's Affiliation |
Osaka University (Osaka Univ.) |
| 4th Author's Name |
Takashi Sato |
| 4th Author's Affiliation |
Tokyo Institute of Technology (Tokyo Inst. Tech.) |
| 5th Author's Name |
Takao Onoye |
| 5th Author's Affiliation |
Osaka University (Osaka Univ.) |
| 6th Author's Name |
|
| 6th Author's Affiliation |
() |
| 7th Author's Name |
|
| 7th Author's Affiliation |
() |
| 8th Author's Name |
|
| 8th Author's Affiliation |
() |
| 9th Author's Name |
|
| 9th Author's Affiliation |
() |
| 10th Author's Name |
|
| 10th Author's Affiliation |
() |
| 11th Author's Name |
|
| 11th Author's Affiliation |
() |
| 12th Author's Name |
|
| 12th Author's Affiliation |
() |
| 13th Author's Name |
|
| 13th Author's Affiliation |
() |
| 14th Author's Name |
|
| 14th Author's Affiliation |
() |
| 15th Author's Name |
|
| 15th Author's Affiliation |
() |
| 16th Author's Name |
|
| 16th Author's Affiliation |
() |
| 17th Author's Name |
|
| 17th Author's Affiliation |
() |
| 18th Author's Name |
|
| 18th Author's Affiliation |
() |
| 19th Author's Name |
|
| 19th Author's Affiliation |
() |
| 20th Author's Name |
|
| 20th Author's Affiliation |
() |
| 21st Author's Name |
|
| 21st Author's Affiliation |
() |
| 22nd Author's Name |
|
| 22nd Author's Affiliation |
() |
| 23rd Author's Name |
|
| 23rd Author's Affiliation |
() |
| 24th Author's Name |
|
| 24th Author's Affiliation |
() |
| 25th Author's Name |
|
| 25th Author's Affiliation |
() |
| 26th Author's Name |
/ / |
| 26th Author's Affiliation |
()
() |
| 27th Author's Name |
/ / |
| 27th Author's Affiliation |
()
() |
| 28th Author's Name |
/ / |
| 28th Author's Affiliation |
()
() |
| 29th Author's Name |
/ / |
| 29th Author's Affiliation |
()
() |
| 30th Author's Name |
/ / |
| 30th Author's Affiliation |
()
() |
| 31st Author's Name |
/ / |
| 31st Author's Affiliation |
()
() |
| 32nd Author's Name |
/ / |
| 32nd Author's Affiliation |
()
() |
| 33rd Author's Name |
/ / |
| 33rd Author's Affiliation |
()
() |
| 34th Author's Name |
/ / |
| 34th Author's Affiliation |
()
() |
| 35th Author's Name |
/ / |
| 35th Author's Affiliation |
()
() |
| 36th Author's Name |
/ / |
| 36th Author's Affiliation |
()
() |
| Speaker |
Author-1 |
| Date Time |
2007-01-18 10:15:00 |
| Presentation Time |
25 minutes |
| Registration for |
ICD |
| Paper # |
CPM2006-132, ICD2006-174 |
| Volume (vol) |
vol.106 |
| Number (no) |
no.467(CPM), no.468(ICD) |
| Page |
pp.19-23 |
| #Pages |
5 |
| Date of Issue |
2007-01-11 (CPM, ICD) |