| Paper Abstract and Keywords |
| Presentation |
2007-01-19 13:00
A Constrained Test Generation Method for Low Power Testing
Yoshiaki Tounoue, Xiaoqing Wen, Seiji Kajihara (K I T), Kohei Miyase (JST), Tatsuya Suzuki, Yuta Yamato (K I T) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
High Power dissipation when the response to a test vector is captured by flip-flops in scan testing which may cause excessive IR drop, resulting in significant capture-induced yield loss. This paper addresses this serious problem with a novel test generation method, featuring a unique algorithm that deterministically generates test cubes not only for fault detection but also for capture power reduction. In general, the number of test patterns tends to increase in low power testing, but the new method achieves capture power reduction with less test set inflation. Experimental results show its effectiveness. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Low Capture Power / ATPG / X-filling / / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 106, no. 468, ICD2006-190, pp. 109-114, Jan. 2007. |
| Paper # |
ICD2006-190 |
| Date of Issue |
2007-01-11 (CPM, ICD) |
| ISSN |
Print edition: ISSN 0913-5685 |
| Download PDF |
|
| Conference Information |
| Committee |
ICD CPM |
| Conference Date |
2007-01-18 - 2007-01-19 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Kika-Shinko-Kaikan Bldg. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
LSI system assembly and module/inteface technology, test, general |
| Paper Information |
| Registration To |
ICD |
| Conference Code |
2007-01-ICD-CPM |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
A Constrained Test Generation Method for Low Power Testing |
| Sub Title (in English) |
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| Keyword(1) |
Low Capture Power |
| Keyword(2) |
ATPG |
| Keyword(3) |
X-filling |
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| 1st Author's Name |
Yoshiaki Tounoue |
| 1st Author's Affiliation |
Kyusyu Institute of Technology (K I T) |
| 2nd Author's Name |
Xiaoqing Wen |
| 2nd Author's Affiliation |
Kyusyu Institute of Technology (K I T) |
| 3rd Author's Name |
Seiji Kajihara |
| 3rd Author's Affiliation |
Kyusyu Institute of Technology (K I T) |
| 4th Author's Name |
Kohei Miyase |
| 4th Author's Affiliation |
Japan Science and Technology Agency (JST) |
| 5th Author's Name |
Tatsuya Suzuki |
| 5th Author's Affiliation |
Kyusyu Institute of Technology (K I T) |
| 6th Author's Name |
Yuta Yamato |
| 6th Author's Affiliation |
Kyusyu Institute of Technology (K I T) |
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| Speaker |
Author-1 |
| Date Time |
2007-01-19 13:00:00 |
| Presentation Time |
25 minutes |
| Registration for |
ICD |
| Paper # |
CPM2006-148, ICD2006-190 |
| Volume (vol) |
vol.106 |
| Number (no) |
no.467(CPM), no.468(ICD) |
| Page |
pp.109-114 |
| #Pages |
6 |
| Date of Issue |
2007-01-11 (CPM, ICD) |