Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2007-03-02 13:30
Development of low self-discharge Ni-MH battery “eneloop" interchangeable with primary dry battery
Shigekazu Yasuoka (SANYO Electric) EE2006-65 CPM2006-158
Abstract (in Japanese) (See Japanese page) 
(in English) Mechanisms of the self-discharge of a Ni-MH battery were investigated. The self-discharge is found to be caused mainly through reduction of the positive electrode , i.e.; by deposition including dissolution of Co, Mn ions from the negative electrode into the separator and the positive electrode, and by a “shuttle effect” with nitrogenous substances. These self- discharge mechanisms can be significantly suppressed by using a super-lattice alloy, which is free from Co and Mn as a negative electrode, and by improving the separator. Based on these results, we have developed a next generation Ni-MH battery named “eneloop” which has low self-discharge characteristics and is able to charge and discharge over 1,000 times.
Keyword (in Japanese) (See Japanese page) 
(in English) Ni-MH battery / hydrogen absorbing alloy / self discharge / eneloop / postive electorde / shuttle effect / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 563, CPM2006-158, pp. 21-24, March 2007.
Paper # CPM2006-158 
Date of Issue 2007-02-23 (EE, CPM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EE2006-65 CPM2006-158

Conference Information
Committee CPM EE  
Conference Date 2007-03-02 - 2007-03-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To CPM 
Conference Code 2007-03-CPM-EE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Development of low self-discharge Ni-MH battery “eneloop" interchangeable with primary dry battery 
Sub Title (in English)  
Keyword(1) Ni-MH battery  
Keyword(2) hydrogen absorbing alloy  
Keyword(3) self discharge  
Keyword(4) eneloop  
Keyword(5) postive electorde  
Keyword(6) shuttle effect  
Keyword(7)  
Keyword(8)  
1st Author's Name Shigekazu Yasuoka  
1st Author's Affiliation SANYO Electric Co., Ltd (SANYO Electric)
2nd Author's Name  
2nd Author's Affiliation ()
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2007-03-02 13:30:00 
Presentation Time 30 minutes 
Registration for CPM 
Paper # EE2006-65, CPM2006-158 
Volume (vol) vol.106 
Number (no) no.562(EE), no.563(CPM) 
Page pp.21-24 
#Pages 4 
Date of Issue 2007-02-23 (EE, CPM) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan