| Paper Abstract and Keywords |
| Presentation |
2007-03-07 17:00
On-chip monitoring for sub-100-nm digital signal integrity
Yoji Bando, Koichiro Noguchi, Makoto Nagata (Kobe Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
A compact on-chip signal monitor circuit uses voltage mode sensing by a source follower circuit with small input device geometry, followed by a shared current output bus. A prototype signal monitor circuit demonstrated a 1.1-GHz effective bandwidth for 1.0-V full-swing digital signals in a 90-nm CMOS technology, where the monitor used 2.5-V I/O CMOS transistors and occupied a 30$\mu$m×120$\mu$m silicon area. We also showed that such signal monitor ciucuits can be tailored to sense of power supply, ground, as well as full-swing logic signal wirings, and form an array with a single current output. Therefore, an on-chip multi-channel signal monitor enables multiple-points as well as multiple-voltagedomain waveform acquisition for the purpose of the in-depth study of digital signal integrity. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
signal integrity / dynamic power supply noise / delay variation / on-chip monitor / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 106, no. 550, ICD2006-207, pp. 61-66, March 2007. |
| Paper # |
ICD2006-207 |
| Date of Issue |
2007-02-28 (VLD, ICD) |
| ISSN |
Print edition: ISSN 0913-5685 |
| Download PDF |
|
| Conference Information |
| Committee |
ICD VLD |
| Conference Date |
2007-03-07 - 2007-03-09 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Mielparque Okinawa |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
System-on-silicon design techniques and related VLSs |
| Paper Information |
| Registration To |
ICD |
| Conference Code |
2007-03-ICD-VLD |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
On-chip monitoring for sub-100-nm digital signal integrity |
| Sub Title (in English) |
|
| Keyword(1) |
signal integrity |
| Keyword(2) |
dynamic power supply noise |
| Keyword(3) |
delay variation |
| Keyword(4) |
on-chip monitor |
| Keyword(5) |
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| Keyword(6) |
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| 1st Author's Name |
Yoji Bando |
| 1st Author's Affiliation |
Kobe University (Kobe Univ.) |
| 2nd Author's Name |
Koichiro Noguchi |
| 2nd Author's Affiliation |
Kobe University (Kobe Univ.) |
| 3rd Author's Name |
Makoto Nagata |
| 3rd Author's Affiliation |
Kobe University (Kobe Univ.) |
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| Speaker |
Author-1 |
| Date Time |
2007-03-07 17:00:00 |
| Presentation Time |
20 minutes |
| Registration for |
ICD |
| Paper # |
VLD2006-116, ICD2006-207 |
| Volume (vol) |
vol.106 |
| Number (no) |
no.547(VLD), no.550(ICD) |
| Page |
pp.61-66 |
| #Pages |
6 |
| Date of Issue |
2007-02-28 (VLD, ICD) |