| Paper Abstract and Keywords |
| Presentation |
2007-03-15 13:30
Reset switching mechanism of ReRAM using thermal reaction model
Yoshihiro Sato, Kentaro Kinoshita, Hideyuki Noshiro, Masaki Aoki, Yoshihiro Sugiyama (FUJITSU LAB.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
We investigated the resistive memory (ReRAM) cells with binary metal oxide (BMO) junctions by applying a short voltage pulse and found that the response time of the RESET process was dependent on the resistance in the low resistive state. The temperature of the filamentary conductive path in the BMO film in the RESET process was estimated to reach the same temperature grade in each RESET by using a thermal conductive equation. The previous experimental relation is well explained by assuming a general thermal chemical reaction model for the RESET process. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
ReRAM / resistive memory / NiO / TiO2 / RESET / thermal chemical reaction model / filament / |
| Reference Info. |
IEICE Tech. Rep., vol. 106, no. 593, SDM2006-255, pp. 7-10, March 2007. |
| Paper # |
SDM2006-255 |
| Date of Issue |
2007-03-08 (SDM) |
| ISSN |
Print edition: ISSN 0913-5685 |
| Download PDF |
|
| Conference Information |
| Committee |
SDM |
| Conference Date |
2007-03-15 - 2007-03-15 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
|
| Paper Information |
| Registration To |
SDM |
| Conference Code |
2007-03-SDM |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Reset switching mechanism of ReRAM using thermal reaction model |
| Sub Title (in English) |
|
| Keyword(1) |
ReRAM |
| Keyword(2) |
resistive memory |
| Keyword(3) |
NiO |
| Keyword(4) |
TiO2 |
| Keyword(5) |
RESET |
| Keyword(6) |
thermal chemical reaction model |
| Keyword(7) |
filament |
| Keyword(8) |
|
| 1st Author's Name |
Yoshihiro Sato |
| 1st Author's Affiliation |
FUJITSU LABORATORIES (FUJITSU LAB.) |
| 2nd Author's Name |
Kentaro Kinoshita |
| 2nd Author's Affiliation |
FUJITSU LABORATORIES (FUJITSU LAB.) |
| 3rd Author's Name |
Hideyuki Noshiro |
| 3rd Author's Affiliation |
FUJITSU LABORATORIES (FUJITSU LAB.) |
| 4th Author's Name |
Masaki Aoki |
| 4th Author's Affiliation |
FUJITSU LABORATORIES (FUJITSU LAB.) |
| 5th Author's Name |
Yoshihiro Sugiyama |
| 5th Author's Affiliation |
FUJITSU LABORATORIES (FUJITSU LAB.) |
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| Speaker |
Author-1 |
| Date Time |
2007-03-15 13:30:00 |
| Presentation Time |
25 minutes |
| Registration for |
SDM |
| Paper # |
SDM2006-255 |
| Volume (vol) |
vol.106 |
| Number (no) |
no.593 |
| Page |
pp.7-10 |
| #Pages |
4 |
| Date of Issue |
2007-03-08 (SDM) |