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Paper Abstract and Keywords
Presentation 2007-09-14 13:10
[Invited Talk] The Latest Trend of Defect Modeling in LSI Diagnosis -- Tutorial --
Yasuo Sato (Hitachi) R2007-32
Abstract (in Japanese) (See Japanese page) 
(in English) This paper addresses the latest trend of defect modeling for LSI diagnosis. Diagnosis methodology finds the suspicious nodes and fault models that mostly match to the faulty response of ATE. Therefore, we need fault models that explain the faulty behavior of real defects well. The reasonable efficiency of diagnosis problem is also required. The paper mainly focuses on bridging fault, open fault, and cell fault.
Keyword (in Japanese) (See Japanese page) 
(in English) diagnosis / fault model / bridging fault / open fault / cell fault / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 213, R2007-32, pp. 17-22, Sept. 2007.
Paper # R2007-32 
Date of Issue 2007-09-07 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2007-32

Conference Information
Committee R  
Conference Date 2007-09-14 - 2007-09-14 
Place (in Japanese) (See Japanese page) 
Place (in English) Kochi Univ. of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) For LSI, evaluation, fault diagnosis, physical analysis and quality 
Paper Information
Registration To R 
Conference Code 2007-09-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) The Latest Trend of Defect Modeling in LSI Diagnosis 
Sub Title (in English) Tutorial 
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Keyword(2) fault model  
Keyword(3) bridging fault  
Keyword(4) open fault  
Keyword(5) cell fault  
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1st Author's Name Yasuo Sato  
1st Author's Affiliation Hitachi, Ltd. (Hitachi)
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Speaker Author-1 
Date Time 2007-09-14 13:10:00 
Presentation Time 30 minutes 
Registration for R 
Paper # R2007-32 
Volume (vol) vol.107 
Number (no) no.213 
Page pp.17-22 
#Pages 6 
Date of Issue 2007-09-07 (R) 

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