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Paper Abstract and Keywords
Presentation 2007-09-28 13:00
SH-SAW propagation characteristics in (11-20) ZnO film/silica glass substrate structures
Atsushi Tanaka (Doshisha Univ.), Takahiko Yanagitani (Tohoku Univ.), Mami Matsukawa, Yoshiaki Watanabe (Doshisha Univ.) US2007-48
Abstract (in Japanese) (See Japanese page) 
(in English) We have reported the fabrication of the (11-20) textured ZnO film without epitaxial technique. An IDT on the (11-20) textured ZnO film can excite SH-SAW. Therefore, the film on various substrates is an attractive option for fabricating the SH-SAW device on a silicon IC, and the device on a curved surface. In this report, the electromechanical coupling coefficients K2 in the ZnO (0º, 90º, ) films/silica glass substrate structures were theoretically estimated. The theoretical results showed that the IDT electrode/ZnO (0º, 90º, 55º) film/silica glass substrate structure had a relatively high K2 value of 3.4 % at H/&#61548=0.21. This structure was then fabricated using RF magnetron sputtering technique. The experimental results demonstrated that SH-SAW was clearly excited in the structure.
Keyword (in Japanese) (See Japanese page) 
(in English) (11-20) textured ZnO film / SH-SAW / RF magnetron sputtering / / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 233, US2007-48, pp. 31-36, Sept. 2007.
Paper # US2007-48 
Date of Issue 2007-09-21 (US) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee US  
Conference Date 2007-09-27 - 2007-09-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Tohoku Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) General 
Paper Information
Registration To US 
Conference Code 2007-09-US 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) SH-SAW propagation characteristics in (11-20) ZnO film/silica glass substrate structures 
Sub Title (in English)  
Keyword(1) (11-20) textured ZnO film  
Keyword(2) SH-SAW  
Keyword(3) RF magnetron sputtering  
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1st Author's Name Atsushi Tanaka  
1st Author's Affiliation Doshisha University (Doshisha Univ.)
2nd Author's Name Takahiko Yanagitani  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Mami Matsukawa  
3rd Author's Affiliation Doshisha University (Doshisha Univ.)
4th Author's Name Yoshiaki Watanabe  
4th Author's Affiliation Doshisha University (Doshisha Univ.)
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Speaker Author-1 
Date Time 2007-09-28 13:00:00 
Presentation Time 30 minutes 
Registration for US 
Paper # US2007-48 
Volume (vol) vol.107 
Number (no) no.233 
Page pp.31-36 
#Pages
Date of Issue 2007-09-21 (US) 


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