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Paper Abstract and Keywords
Presentation 2007-10-30 13:45
Electro-Thermal Compact Model for Reset Operation of Phase Change Memories
Atsushi Sakai, Kenichiro Sonoda, Masahiro Moniwa, Kiyoshi Ishikawa, Osamu Tsuchiya, Yasuo Inoue (Renesas Technology Corp.) VLD2007-55 SDM2007-199 Link to ES Tech. Rep. Archives: SDM2007-199
Abstract (in Japanese) (See Japanese page) 
(in English) A three-dimensional (3D) electro-thermal compact model for the reset operation of a phase change memory (PCM) cell is presented.
This model takes into account three-dimensional spreading of heat flux and current flow which depend on the PCM cell structure.
The interface thermal resistance, which has a crucial effect on the thermal conduction in a PCM cell, is also considered.
The accuracy of the model is confirmed by comparing the simulation results with measurement.
In addition, the scalability of PCM is also discussed from the process
fluctuation point of view.
Keyword (in Japanese) (See Japanese page) 
(in English) phase change memory / reset operation / electro-thermal compact model / interface thermal resistance / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 297, SDM2007-199, pp. 23-26, Oct. 2007.
Paper # SDM2007-199 
Date of Issue 2007-10-23 (VLD, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2007-55 SDM2007-199 Link to ES Tech. Rep. Archives: SDM2007-199

Conference Information
Committee SDM VLD  
Conference Date 2007-10-30 - 2007-10-31 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Process, Device, Circuit Simulation, etc. 
Paper Information
Registration To SDM 
Conference Code 2007-10-SDM-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Electro-Thermal Compact Model for Reset Operation of Phase Change Memories 
Sub Title (in English)  
Keyword(1) phase change memory  
Keyword(2) reset operation  
Keyword(3) electro-thermal compact model  
Keyword(4) interface thermal resistance  
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1st Author's Name Atsushi Sakai  
1st Author's Affiliation Renesas Technology Corporation (Renesas Technology Corp.)
2nd Author's Name Kenichiro Sonoda  
2nd Author's Affiliation Renesas Technology Corporation (Renesas Technology Corp.)
3rd Author's Name Masahiro Moniwa  
3rd Author's Affiliation Renesas Technology Corporation (Renesas Technology Corp.)
4th Author's Name Kiyoshi Ishikawa  
4th Author's Affiliation Renesas Technology Corporation (Renesas Technology Corp.)
5th Author's Name Osamu Tsuchiya  
5th Author's Affiliation Renesas Technology Corporation (Renesas Technology Corp.)
6th Author's Name Yasuo Inoue  
6th Author's Affiliation Renesas Technology Corporation (Renesas Technology Corp.)
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Speaker Author-1 
Date Time 2007-10-30 13:45:00 
Presentation Time 25 minutes 
Registration for SDM 
Paper # VLD2007-55, SDM2007-199 
Volume (vol) vol.107 
Number (no) no.295(VLD), no.297(SDM) 
Page pp.23-26 
#Pages
Date of Issue 2007-10-23 (VLD, SDM) 


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