Paper Abstract and Keywords |
Presentation |
2007-10-30 13:45
Electro-Thermal Compact Model for Reset Operation of Phase Change Memories Atsushi Sakai, Kenichiro Sonoda, Masahiro Moniwa, Kiyoshi Ishikawa, Osamu Tsuchiya, Yasuo Inoue (Renesas Technology Corp.) VLD2007-55 SDM2007-199 Link to ES Tech. Rep. Archives: SDM2007-199 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
A three-dimensional (3D) electro-thermal compact model for the reset operation of a phase change memory (PCM) cell is presented.
This model takes into account three-dimensional spreading of heat flux and current flow which depend on the PCM cell structure.
The interface thermal resistance, which has a crucial effect on the thermal conduction in a PCM cell, is also considered.
The accuracy of the model is confirmed by comparing the simulation results with measurement.
In addition, the scalability of PCM is also discussed from the process
fluctuation point of view. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
phase change memory / reset operation / electro-thermal compact model / interface thermal resistance / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 107, no. 297, SDM2007-199, pp. 23-26, Oct. 2007. |
Paper # |
SDM2007-199 |
Date of Issue |
2007-10-23 (VLD, SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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VLD2007-55 SDM2007-199 Link to ES Tech. Rep. Archives: SDM2007-199 |
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