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Paper Abstract and Keywords
Presentation 2007-11-01 10:50
Highly reliable guardring-free planar InAlAs avalanche photodiode
Eitaro Ishimura, Eiji Yagyu, Masaharu Nakaji, Susumu Ihara, Kiichi Yoshiara, Toshitaka Aoyagi, Yasunori Tokuda, Takahide Ishikawa (Mitsubishi Electric Corp.) OCS2007-43 OPE2007-98 LQE2007-84
Abstract (in Japanese) (See Japanese page) 
(in English) he InAlAs avalanche photodiode with a guardring-free structure that reduces the bias voltage of the pn-junction of top surface exhibits a record high reliability of over 8000 hours at a high temperature of 200 oC without any degradation mode on the surfaced pn junction.
Keyword (in Japanese) (See Japanese page) 
(in English) APD / avalanche photodiode / reliability / 10Gbps / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 302, LQE2007-84, pp. 19-22, Nov. 2007.
Paper # LQE2007-84 
Date of Issue 2007-10-25 (OCS, OPE, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF OCS2007-43 OPE2007-98 LQE2007-84

Conference Information
Committee LQE OPE OCS  
Conference Date 2007-11-01 - 2007-11-02 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To LQE 
Conference Code 2007-11-LQE-OPE-OCS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Highly reliable guardring-free planar InAlAs avalanche photodiode 
Sub Title (in English)  
Keyword(1) APD  
Keyword(2) avalanche photodiode  
Keyword(3) reliability  
Keyword(4) 10Gbps  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Eitaro Ishimura  
1st Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric Corp.)
2nd Author's Name Eiji Yagyu  
2nd Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric Corp.)
3rd Author's Name Masaharu Nakaji  
3rd Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric Corp.)
4th Author's Name Susumu Ihara  
4th Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric Corp.)
5th Author's Name Kiichi Yoshiara  
5th Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric Corp.)
6th Author's Name Toshitaka Aoyagi  
6th Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric Corp.)
7th Author's Name Yasunori Tokuda  
7th Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric Corp.)
8th Author's Name Takahide Ishikawa  
8th Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric Corp.)
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Speaker Author-1 
Date Time 2007-11-01 10:50:00 
Presentation Time 25 minutes 
Registration for LQE 
Paper # OCS2007-43, OPE2007-98, LQE2007-84 
Volume (vol) vol.107 
Number (no) no.300(OCS), no.301(OPE), no.302(LQE) 
Page pp.19-22 
#Pages 4 
Date of Issue 2007-10-25 (OCS, OPE, LQE) 

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