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Paper Abstract and Keywords
Presentation 2007-11-09 12:55
Insertion Effects of V2O5 Thin Films into CuPc Field-Effect Transistors
Toshiaki Takahashi, Shohei Kitamura, Masahiro Minagawa, Yasuo Ohdaira, Akira Baba, Kazunari Shinbo, Keizo Kato, Futao Kaneko (Niigata Univ.) OME2007-49
Abstract (in Japanese) (See Japanese page) 
(in English) A large drain current was observed in the organic field-effect transistors (OFETs). The OFETs were prepared with hole-conductive copper phthalocyanine (CuPc) and vanadium oxide (V2O5). It was found that a drain current in the OFET with V2O5 layer was increased about twice one without V2O5 layer. And the effect was obtained in the both structure of top and bottom contact type device. It seemed that the increasing of a drain current was affected by the interaction between CuPc and V2O5 molecular, because no field-effect property was obderved in the V2O5 mono layer FET.The results of this study were very useful for the development of the OFET which could conduct a large drain current.
Keyword (in Japanese) (See Japanese page) 
(in English) organic field-effect transistor / copper phthalocyanine / vanadium oxide / / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 307, OME2007-49, pp. 7-10, Nov. 2007.
Paper # OME2007-49 
Date of Issue 2007-11-02 (OME) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee OME  
Conference Date 2007-11-09 - 2007-11-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Niigata Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To OME 
Conference Code 2007-11-OME 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Insertion Effects of V2O5 Thin Films into CuPc Field-Effect Transistors 
Sub Title (in English)  
Keyword(1) organic field-effect transistor  
Keyword(2) copper phthalocyanine  
Keyword(3) vanadium oxide  
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1st Author's Name Toshiaki Takahashi  
1st Author's Affiliation Niigata University (Niigata Univ.)
2nd Author's Name Shohei Kitamura  
2nd Author's Affiliation Niigata University (Niigata Univ.)
3rd Author's Name Masahiro Minagawa  
3rd Author's Affiliation Niigata University (Niigata Univ.)
4th Author's Name Yasuo Ohdaira  
4th Author's Affiliation Niigata University (Niigata Univ.)
5th Author's Name Akira Baba  
5th Author's Affiliation Niigata University (Niigata Univ.)
6th Author's Name Kazunari Shinbo  
6th Author's Affiliation Niigata University (Niigata Univ.)
7th Author's Name Keizo Kato  
7th Author's Affiliation Niigata University (Niigata Univ.)
8th Author's Name Futao Kaneko  
8th Author's Affiliation Niigata University (Niigata Univ.)
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Speaker Author-1 
Date Time 2007-11-09 12:55:00 
Presentation Time 25 minutes 
Registration for OME 
Paper # OME2007-49 
Volume (vol) vol.107 
Number (no) no.307 
Page pp.7-10 
#Pages
Date of Issue 2007-11-02 (OME) 


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