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Paper Abstract and Keywords
Presentation 2007-11-16 14:15
High Stability of Drain Current at High Temperatures in Multi-Mesa-Channel AlGaN/GaN HEMT
Takahiro Tamura, Junji Kotani, Kota Ohi, Tamotsu Hashizume (Hokkaido Univ.) R2007-49 ED2007-182 SDM2007-217 Link to ES Tech. Rep. Archives: ED2007-182 SDM2007-217
Abstract (in Japanese) (See Japanese page) 
(in English) We fabricated a multi-mesa-channel (MMC) structure by forming a periodic trench just under a gate electrode to improve the uniformity of effective electric field in the channel in an AlGaN/GaN high electron mobility transistor (HEMT). The MMC HEMT showed a shallower threshold voltage than that of a conventional planar device. In addition, a unique performance, i.e., a nearly temperature-independent saturation drain current, was observed in the MMC device in a wide temperature range from 120 K to 500 K. A 2-dimensional potential calculation indicates that the mesa-side gate effectively modulates the potential, resulting in a field surrounding 2-dimensional electron gas (2DEG). Such a surrounding-field effect and a relatively lower source access resistance may be related to a unique current behavior in the MMC HEMT.
Keyword (in Japanese) (See Japanese page) 
(in English) GaN / AlGaN / high electron mobility transistor(HEMT) / multi-mesa-channel (MMC) structure / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 319, ED2007-182, pp. 19-22, Nov. 2007.
Paper # ED2007-182 
Date of Issue 2007-11-09 (R, ED, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF R2007-49 ED2007-182 SDM2007-217 Link to ES Tech. Rep. Archives: ED2007-182 SDM2007-217

Conference Information
Committee SDM R ED  
Conference Date 2007-11-16 - 2007-11-16 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
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Paper Information
Registration To ED 
Conference Code 2007-11-SDM-R-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) High Stability of Drain Current at High Temperatures in Multi-Mesa-Channel AlGaN/GaN HEMT 
Sub Title (in English)  
Keyword(1) GaN  
Keyword(2) AlGaN  
Keyword(3) high electron mobility transistor(HEMT)  
Keyword(4) multi-mesa-channel (MMC) structure  
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1st Author's Name Takahiro Tamura  
1st Author's Affiliation Hokkaido University (Hokkaido Univ.)
2nd Author's Name Junji Kotani  
2nd Author's Affiliation Hokkaido University (Hokkaido Univ.)
3rd Author's Name Kota Ohi  
3rd Author's Affiliation Hokkaido University (Hokkaido Univ.)
4th Author's Name Tamotsu Hashizume  
4th Author's Affiliation Hokkaido University (Hokkaido Univ.)
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Speaker Author-1 
Date Time 2007-11-16 14:15:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # R2007-49, ED2007-182, SDM2007-217 
Volume (vol) vol.107 
Number (no) no.318(R), no.319(ED), no.320(SDM) 
Page pp.19-22 
#Pages
Date of Issue 2007-11-09 (R, ED, SDM) 


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