Paper Abstract and Keywords |
Presentation |
2007-11-16 14:15
High Stability of Drain Current at High Temperatures in Multi-Mesa-Channel AlGaN/GaN HEMT Takahiro Tamura, Junji Kotani, Kota Ohi, Tamotsu Hashizume (Hokkaido Univ.) R2007-49 ED2007-182 SDM2007-217 Link to ES Tech. Rep. Archives: ED2007-182 SDM2007-217 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We fabricated a multi-mesa-channel (MMC) structure by forming a periodic trench just under a gate electrode to improve the uniformity of effective electric field in the channel in an AlGaN/GaN high electron mobility transistor (HEMT). The MMC HEMT showed a shallower threshold voltage than that of a conventional planar device. In addition, a unique performance, i.e., a nearly temperature-independent saturation drain current, was observed in the MMC device in a wide temperature range from 120 K to 500 K. A 2-dimensional potential calculation indicates that the mesa-side gate effectively modulates the potential, resulting in a field surrounding 2-dimensional electron gas (2DEG). Such a surrounding-field effect and a relatively lower source access resistance may be related to a unique current behavior in the MMC HEMT. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
GaN / AlGaN / high electron mobility transistor(HEMT) / multi-mesa-channel (MMC) structure / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 107, no. 319, ED2007-182, pp. 19-22, Nov. 2007. |
Paper # |
ED2007-182 |
Date of Issue |
2007-11-09 (R, ED, SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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Download PDF |
R2007-49 ED2007-182 SDM2007-217 Link to ES Tech. Rep. Archives: ED2007-182 SDM2007-217 |
Conference Information |
Committee |
SDM R ED |
Conference Date |
2007-11-16 - 2007-11-16 |
Place (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
ED |
Conference Code |
2007-11-SDM-R-ED |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
High Stability of Drain Current at High Temperatures in Multi-Mesa-Channel AlGaN/GaN HEMT |
Sub Title (in English) |
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Keyword(1) |
GaN |
Keyword(2) |
AlGaN |
Keyword(3) |
high electron mobility transistor(HEMT) |
Keyword(4) |
multi-mesa-channel (MMC) structure |
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1st Author's Name |
Takahiro Tamura |
1st Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
2nd Author's Name |
Junji Kotani |
2nd Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
3rd Author's Name |
Kota Ohi |
3rd Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
4th Author's Name |
Tamotsu Hashizume |
4th Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
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Speaker |
Author-1 |
Date Time |
2007-11-16 14:15:00 |
Presentation Time |
25 minutes |
Registration for |
ED |
Paper # |
R2007-49, ED2007-182, SDM2007-217 |
Volume (vol) |
vol.107 |
Number (no) |
no.318(R), no.319(ED), no.320(SDM) |
Page |
pp.19-22 |
#Pages |
4 |
Date of Issue |
2007-11-09 (R, ED, SDM) |
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