| Paper Abstract and Keywords |
| Presentation |
2008-01-18 11:10
[Tutorial Lecture]
Survey of Analysis Techniques for On-chip Power Distribution Networks Takashi Sato (Tokyo Tech.) CPM2007-140 ICD2007-151 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
Primary techniques and recent trends in power distribution network
(PDN) analysis are reviewed in this paper. Quality of PDN in an LSI is
critically important because it determines performance and stability of
the LSI. However, the PDN analysis is one of the most time and memory
demanding jobs in LSI designs, making efficient PDN design a difficult
task. In order to realize optimal PDN, various analyzing methodologies
have been proposed. Understanding how those analyses are conducted
helps designers conceive better ideas for improving their PDN design
efficiently. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Power distribution network / supply voltage fluctuation / power integrity / nodal analysis / modified nodal analysis / reduction / / |
| Reference Info. |
IEICE Tech. Rep., vol. 107, no. 425, CPM2007-140, pp. 71-76, Jan. 2008. |
| Paper # |
CPM2007-140 |
| Date of Issue |
2008-01-10 (CPM, ICD) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
CPM2007-140 ICD2007-151 |
| Conference Information |
| Committee |
CPM ICD |
| Conference Date |
2008-01-17 - 2008-01-18 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Kikai-Shinko-Kaikan Bldg |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
|
| Paper Information |
| Registration To |
CPM |
| Conference Code |
2008-01-CPM-ICD |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Survey of Analysis Techniques for On-chip Power Distribution Networks |
| Sub Title (in English) |
|
| Keyword(1) |
Power distribution network |
| Keyword(2) |
supply voltage fluctuation |
| Keyword(3) |
power integrity |
| Keyword(4) |
nodal analysis |
| Keyword(5) |
modified nodal analysis |
| Keyword(6) |
reduction |
| Keyword(7) |
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| Keyword(8) |
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| 1st Author's Name |
Takashi Sato |
| 1st Author's Affiliation |
Tokyo Institute of Technology (Tokyo Tech.) |
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| Speaker |
Author-1 |
| Date Time |
2008-01-18 11:10:00 |
| Presentation Time |
50 minutes |
| Registration for |
CPM |
| Paper # |
CPM2007-140, ICD2007-151 |
| Volume (vol) |
vol.107 |
| Number (no) |
no.425(CPM), no.426(ICD) |
| Page |
pp.71-76 |
| #Pages |
6 |
| Date of Issue |
2008-01-10 (CPM, ICD) |