Paper Abstract and Keywords |
Presentation |
2008-03-06 16:35
Comparison of Power consumption between dynamic voltage scheme and multi-supply voltage scheme for system LSI Satoshi Hanami, Shigeyoshi Watanabe (Shonan Inst. of Tech.) VLD2007-155 ICD2007-178 Link to ES Tech. Rep. Archives: ICD2007-178 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Reduction of power dissipation caused by dynamic current, gate leakage current, and subthreshold leakage current of multi-supply-voltage and dynamic voltage scheme for product-sum operation. The reduction ratio of power dissipation of dynamic voltage scheme is larger than that of multi-supply-voltage scheme. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
system LSI / dual supply voltage scheme / dynamic current / gate leakage current / subthreshold leakage current / MOSFET / scaling rule / path-delay distribution |
Reference Info. |
IEICE Tech. Rep., vol. 107, no. 510, ICD2007-178, pp. 67-72, March 2008. |
Paper # |
ICD2007-178 |
Date of Issue |
2008-02-28 (VLD, ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
VLD2007-155 ICD2007-178 Link to ES Tech. Rep. Archives: ICD2007-178 |
Conference Information |
Committee |
VLD ICD |
Conference Date |
2008-03-05 - 2008-03-07 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
TiRuRu |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
System-on-silicon design techniques and related VLSs |
Paper Information |
Registration To |
ICD |
Conference Code |
2008-03-VLD-ICD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Comparison of Power consumption between dynamic voltage scheme and multi-supply voltage scheme for system LSI |
Sub Title (in English) |
|
Keyword(1) |
system LSI |
Keyword(2) |
dual supply voltage scheme |
Keyword(3) |
dynamic current |
Keyword(4) |
gate leakage current |
Keyword(5) |
subthreshold leakage current |
Keyword(6) |
MOSFET |
Keyword(7) |
scaling rule |
Keyword(8) |
path-delay distribution |
1st Author's Name |
Satoshi Hanami |
1st Author's Affiliation |
Shonan Institute of Technology (Shonan Inst. of Tech.) |
2nd Author's Name |
Shigeyoshi Watanabe |
2nd Author's Affiliation |
Shonan Institute of Technology (Shonan Inst. of Tech.) |
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Speaker |
Author-1 |
Date Time |
2008-03-06 16:35:00 |
Presentation Time |
25 minutes |
Registration for |
ICD |
Paper # |
VLD2007-155, ICD2007-178 |
Volume (vol) |
vol.107 |
Number (no) |
no.507(VLD), no.510(ICD) |
Page |
pp.67-72 |
#Pages |
6 |
Date of Issue |
2008-02-28 (VLD, ICD) |
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