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Paper Abstract and Keywords
Presentation 2008-04-18 14:05
Analysis of Wear-Out Degradation of a Ru-doped SIBH InGaAsP DFB laser Using an Optical-Beam-Induced Current Monitor
Tatsuya Takeshita, Ryuzo Iga, Mitsuru Sugo, Yasuhiro Kondo (NTT) R2008-3 CPM2008-3 OPE2008-3
Abstract (in Japanese) (See Japanese page) 
(in English) We investigated the degradation behavior of InGaAsP distributed feedback lasers (DFBs) at high temperature by employing the optical-beam-induced current (OBIC) measurement technique. The DFB lasers with Ru-doped semi-insulating buried heterostructure operated very stably at an ambient temperature of 85℃. It is found that there is more degradation in the SCH layer than in the active layer. We presume that the degradation mechanism is governed by diffused defects with a vertical direction in the crystal plane.
Keyword (in Japanese) (See Japanese page) 
(in English) semiconductor lasers / quantum well lasers / failure analysis / reliability / aging / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 7, R2008-3, pp. 11-16, April 2008.
Paper # R2008-3 
Date of Issue 2008-04-11 (R, CPM, OPE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2008-3 CPM2008-3 OPE2008-3

Conference Information
Committee OPE CPM R  
Conference Date 2008-04-18 - 2008-04-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2008-04-OPE-CPM-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Analysis of Wear-Out Degradation of a Ru-doped SIBH InGaAsP DFB laser Using an Optical-Beam-Induced Current Monitor 
Sub Title (in English)  
Keyword(1) semiconductor lasers  
Keyword(2) quantum well lasers  
Keyword(3) failure analysis  
Keyword(4) reliability  
Keyword(5) aging  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Tatsuya Takeshita  
1st Author's Affiliation NTT Corporation (NTT)
2nd Author's Name Ryuzo Iga  
2nd Author's Affiliation NTT Corporation (NTT)
3rd Author's Name Mitsuru Sugo  
3rd Author's Affiliation NTT Corporation (NTT)
4th Author's Name Yasuhiro Kondo  
4th Author's Affiliation NTT Corporation (NTT)
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Speaker Author-1 
Date Time 2008-04-18 14:05:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2008-3, CPM2008-3, OPE2008-3 
Volume (vol) vol.108 
Number (no) no.7(R), no.8(CPM), no.9(OPE) 
Page pp.11-16 
#Pages 6 
Date of Issue 2008-04-11 (R, CPM, OPE) 

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