Paper Abstract and Keywords |
Presentation |
2008-06-09 15:50
HoleSubband Dispersion in Si inversion Layers Sakura N. Takeda, Makoto Morita, Takuya Ohsugi, Yohei Tanigawa, Hiroshi Daimon (NAIST) SDM2008-44 Link to ES Tech. Rep. Archives: SDM2008-44 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Subband dispersion quantized in Si inversion layer was measured by Angle-resolved photoemission spectroscopy.
The dispersion structure and its in-plane anisotropy was found to be basically same as the bulk Si. This
means that the effective mass is not changed by the quantization. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Silicon / Inversion layer / subband dispersion, / effective mass / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 108, no. 80, SDM2008-44, pp. 13-16, June 2008. |
Paper # |
SDM2008-44 |
Date of Issue |
2008-06-02 (SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
SDM2008-44 Link to ES Tech. Rep. Archives: SDM2008-44 |
Conference Information |
Committee |
SDM |
Conference Date |
2008-06-09 - 2008-06-10 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
An401・402, Inst. Indus. Sci., The Univ. of Tokyo |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Science and Sci. & Technol. for Thin Dielectrics for MIS Devices |
Paper Information |
Registration To |
SDM |
Conference Code |
2008-06-SDM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
HoleSubband Dispersion in Si inversion Layers |
Sub Title (in English) |
|
Keyword(1) |
Silicon |
Keyword(2) |
Inversion layer |
Keyword(3) |
subband dispersion, |
Keyword(4) |
effective mass |
Keyword(5) |
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Keyword(6) |
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1st Author's Name |
Sakura N. Takeda |
1st Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
2nd Author's Name |
Makoto Morita |
2nd Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
3rd Author's Name |
Takuya Ohsugi |
3rd Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
4th Author's Name |
Yohei Tanigawa |
4th Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
5th Author's Name |
Hiroshi Daimon |
5th Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
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Speaker |
Author-1 |
Date Time |
2008-06-09 15:50:00 |
Presentation Time |
25 minutes |
Registration for |
SDM |
Paper # |
SDM2008-44 |
Volume (vol) |
vol.108 |
Number (no) |
no.80 |
Page |
pp.13-16 |
#Pages |
4 |
Date of Issue |
2008-06-02 (SDM) |
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