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Paper Abstract and Keywords
Presentation 2008-07-17 09:50
Reduction of Vth Variation Utilizing HfSiOx for 45nm SRAM
Gen Tsutsui, Kazuaki Tsunoda, Nayuta Kariya, Yutaka Akiyama, Tomohisa Abe, Shinya Maruyama, Tadashi Fukase, Mieko Suzuki, Yasushi Yamagata, Kiyotaka Imai (NECEL) SDM2008-130 ICD2008-40
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
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Reference Info. IEICE Tech. Rep., vol. 108, no. 139, SDM2008-130, pp. 11-16, July 2008.
Paper # SDM2008-130 
Date of Issue 2008-07-10 (SDM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2008-130 ICD2008-40

Conference Information
Committee ICD SDM  
Conference Date 2008-07-17 - 2008-07-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To SDM 
Conference Code 2008-07-ICD-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Reduction of Vth Variation Utilizing HfSiOx for 45nm SRAM 
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1st Author's Name Gen Tsutsui  
1st Author's Affiliation NEC Electronics Corporation (NECEL)
2nd Author's Name Kazuaki Tsunoda  
2nd Author's Affiliation NEC Electronics Corporation (NECEL)
3rd Author's Name Nayuta Kariya  
3rd Author's Affiliation NEC Electronics Corporation (NECEL)
4th Author's Name Yutaka Akiyama  
4th Author's Affiliation NEC Electronics Corporation (NECEL)
5th Author's Name Tomohisa Abe  
5th Author's Affiliation NEC Electronics Corporation (NECEL)
6th Author's Name Shinya Maruyama  
6th Author's Affiliation NEC Electronics Corporation (NECEL)
7th Author's Name Tadashi Fukase  
7th Author's Affiliation NEC Electronics Corporation (NECEL)
8th Author's Name Mieko Suzuki  
8th Author's Affiliation NEC Electronics Corporation (NECEL)
9th Author's Name Yasushi Yamagata  
9th Author's Affiliation NEC Electronics Corporation (NECEL)
10th Author's Name Kiyotaka Imai  
10th Author's Affiliation NEC Electronics Corporation (NECEL)
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Speaker Author-1 
Date Time 2008-07-17 09:50:00 
Presentation Time 25 minutes 
Registration for SDM 
Paper # SDM2008-130, ICD2008-40 
Volume (vol) vol.108 
Number (no) no.139(SDM), no.140(ICD) 
Page pp.11-16 
#Pages 6 
Date of Issue 2008-07-10 (SDM, ICD) 

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