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Paper Abstract and Keywords
Presentation 2008-08-01 10:00
A Code Review Technique to Reduce Regression Test Cases for Omitted Fault
Koichi Tamura, Yasutaka Kamei, Hidetake Uwano, Shuuji Morisaki, Tomoko Matsumura, Ken-ichi Matsumoto (NAIST) SS2008-23
Abstract (in Japanese) (See Japanese page) 
(in English) Some faults need many re-testing for fixing faults in test phase. These faults increase cost and delay of release, and may involve the risk of second fault for omiting the needed test. In this paper, using a test plan document, we conduct the review considering regression test cases for omitted fault in code review and evaluate its review technique effect. The reduction of test effort was expected by preferential detecting the fault that supposably derive many regression test cases. We compare its technique to Ad-hoc reading by the experiment that aim at code review. The result showed that the regression test-based reading could reduce more regression test cases than Ad-hoc reading.
Keyword (in Japanese) (See Japanese page) 
(in English) Software Review / Test Case / Regression Test / / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 173, SS2008-23, pp. 61-66, July 2008.
Paper # SS2008-23 
Date of Issue 2008-07-24 (SS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SS2008-23

Conference Information
Committee SS  
Conference Date 2008-07-31 - 2008-08-01 
Place (in Japanese) (See Japanese page) 
Place (in English) Future University-Hakodate 
Topics (in Japanese) (See Japanese page) 
Topics (in English) general 
Paper Information
Registration To SS 
Conference Code 2008-07-SS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Code Review Technique to Reduce Regression Test Cases for Omitted Fault 
Sub Title (in English)  
Keyword(1) Software Review  
Keyword(2) Test Case  
Keyword(3) Regression Test  
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1st Author's Name Koichi Tamura  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Yasutaka Kamei  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Hidetake Uwano  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name Shuuji Morisaki  
4th Author's Affiliation Nara Institute of Science and Technology (NAIST)
5th Author's Name Tomoko Matsumura  
5th Author's Affiliation Nara Institute of Science and Technology (NAIST)
6th Author's Name Ken-ichi Matsumoto  
6th Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker Author-1 
Date Time 2008-08-01 10:00:00 
Presentation Time 30 minutes 
Registration for SS 
Paper # SS2008-23 
Volume (vol) vol.108 
Number (no) no.173 
Page pp.61-66 
#Pages 6 
Date of Issue 2008-07-24 (SS) 

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