Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2008-08-04 14:25
Field Emission Characteristics of Sputter Deposited Carbon Films
Kei Miyazaki, Yoshiyuki Taguchi, Hirofumi Saito, Takuya Miyanaga, Tomohiko Yamakami, Rinpei Hayashibe, Kiichi Kamimura (Shinshu Univ.) CPM2008-42
Abstract (in Japanese) (See Japanese page) 
(in English) The field emission characteristics of sputter deposited carbon films were measured and discussed. The low threshold field was obtained in the field emission characteristics of the sample deposited under rather high sputtering pressure of about 150 mTorr. The emission current saturated at high field region. The one of the reasons of this phenomenon was found to be field re-distribution caused by potential drop resulted from series resistance of current paths.
Keyword (in Japanese) (See Japanese page) 
(in English) field emission / carbon film / series resistanc / sputtering / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 178, CPM2008-42, pp. 5-8, Aug. 2008.
Paper # CPM2008-42 
Date of Issue 2008-07-28 (CPM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPM2008-42

Conference Information
Committee CPM  
Conference Date 2008-08-04 - 2008-08-04 
Place (in Japanese) (See Japanese page) 
Place (in English) Muroran Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Electronic Component Parts and Materials, etc. 
Paper Information
Registration To CPM 
Conference Code 2008-08-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Field Emission Characteristics of Sputter Deposited Carbon Films 
Sub Title (in English)  
Keyword(1) field emission  
Keyword(2) carbon film  
Keyword(3) series resistanc  
Keyword(4) sputtering  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kei Miyazaki  
1st Author's Affiliation Shinshu University (Shinshu Univ.)
2nd Author's Name Yoshiyuki Taguchi  
2nd Author's Affiliation Shinshu University (Shinshu Univ.)
3rd Author's Name Hirofumi Saito  
3rd Author's Affiliation Shinshu University (Shinshu Univ.)
4th Author's Name Takuya Miyanaga  
4th Author's Affiliation Shinshu University (Shinshu Univ.)
5th Author's Name Tomohiko Yamakami  
5th Author's Affiliation Shinshu University (Shinshu Univ.)
6th Author's Name Rinpei Hayashibe  
6th Author's Affiliation Shinshu University (Shinshu Univ.)
7th Author's Name Kiichi Kamimura  
7th Author's Affiliation Shinshu University (Shinshu Univ.)
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2008-08-04 14:25:00 
Presentation Time 25 minutes 
Registration for CPM 
Paper # CPM2008-42 
Volume (vol) vol.108 
Number (no) no.178 
Page pp.5-8 
#Pages
Date of Issue 2008-07-28 (CPM) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan