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Paper Abstract and Keywords
Presentation 2008-09-26 14:30
A Discussion about the Malfunction and the Electromagnetic Immunity of an Information Technology Equipment under HPEM environments
Hidenori Sekiguchi, Shinji Seto (NICT), Ikuya Minematsu (KEC) EMCJ2008-53
Abstract (in Japanese) (See Japanese page) 
(in English) Electromagnetic disturbances might cause information technology equipments (ITEs) to malfunction and to be broken down. International standardizations provide uniform requirements for the immunity of ITEs.
However, the transmitter that is chopped or used illegally can radiate electromagnetic disturbance that is higher power than the immunity level of ITE. In terms of information security, the intentional lectromagnetic interference for ITEs becomes one of important issues, because by which information might not be able to communicate. In this study, the mmunity limit of ITEs is investigated under high-power electromagnetic (HPEM) environments that are discussed on a test method and environment built. This paper presents the investigation results of the relation
between the malfunction and the immunity level of Ethernet hubs that are put in the HPEM environments.
Keyword (in Japanese) (See Japanese page) 
(in English) information security / information technology equipments / intentional electromagnetic interference / high power electromagnetics environments / immunity / HUB / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 222, EMCJ2008-53, pp. 19-24, Sept. 2008.
Paper # EMCJ2008-53 
Date of Issue 2008-09-19 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2008-09-26 - 2008-09-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Osaka Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2008-09-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Discussion about the Malfunction and the Electromagnetic Immunity of an Information Technology Equipment under HPEM environments 
Sub Title (in English)  
Keyword(1) information security  
Keyword(2) information technology equipments  
Keyword(3) intentional electromagnetic interference  
Keyword(4) high power electromagnetics environments  
Keyword(5) immunity  
Keyword(6) HUB  
Keyword(7)  
Keyword(8)  
1st Author's Name Hidenori Sekiguchi  
1st Author's Affiliation National Institute of Information and Communications Technology (NICT)
2nd Author's Name Shinji Seto  
2nd Author's Affiliation National Institute of Information and Communications Technology (NICT)
3rd Author's Name Ikuya Minematsu  
3rd Author's Affiliation Kansai Electronic Industry Development Center (KEC)
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Speaker Author-1 
Date Time 2008-09-26 14:30:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2008-53 
Volume (vol) vol.108 
Number (no) no.222 
Page pp.19-24 
#Pages
Date of Issue 2008-09-19 (EMCJ) 


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