| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2008-10-17 09:20 An analysis of relationship between code clone length and software reliability Hiroki Sato, Yasutaka Kamei, Hidetake Uwano, Akito Monden, Shinji Kawaguchi, Masataka Nagura, Ken-ichi Matsumoto, Hajimu Iida (NAIST)  SS2008-34 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | A code clone that is duplicated code section in source files makes software maintenance more difficult. However, to our knowledge, no study has analyzed how the code clone influences software reliability. In this paper, we focused on the length of the code clone in order to analyze the relation between software reliability and code clone. We analyzed a repository of a project, classified source code files according to the length of the code clone included in the files, and measured the bug density of each classified file group. As a result, it was clarified that (1) the bug density of the file group that contained a short code clone was high, and (2) the bug density of the file group that contained a long code clone was low. In addition, because we had thought the bug density was influenced from the length of each source code file , we classified the files by measuring lines of source code and examined how much the bug density of each file group changed. We observed that the result (1), (2) became more pronounced when lines of source code was comparatively large. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Code clone / Length of code clone / Software reliability / Bug density / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 108, no. 242, SS2008-34, pp. 43-48, Oct. 2008. | |
| Paper # | SS2008-34 | |
| Date of Issue | 2008-10-09 (SS) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SS2008-34 |
|
| Conference Information | |
| Committee | SS |
| Conference Date | 2008-10-16 - 2008-10-17 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | University of Yamanashi, Kofu Campus |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | general |
| Paper Information | |
| Registration To | SS |
| Conference Code | 2008-10-SS |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An analysis of relationship between code clone length and software reliability |
| Sub Title (in English) | |
| Keyword(1) | Code clone |
| Keyword(2) | Length of code clone |
| Keyword(3) | Software reliability |
| Keyword(4) | Bug density |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Hiroki Sato |
| 1st Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 2nd Author's Name | Yasutaka Kamei |
| 2nd Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 3rd Author's Name | Hidetake Uwano |
| 3rd Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 4th Author's Name | Akito Monden |
| 4th Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 5th Author's Name | Shinji Kawaguchi |
| 5th Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 6th Author's Name | Masataka Nagura |
| 6th Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 7th Author's Name | Ken-ichi Matsumoto |
| 7th Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 8th Author's Name | Hajimu Iida |
| 8th Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| Speaker | Author-1 |
| Date Time | 2008-10-17 09:20:00 |
| Presentation Time | 30 minutes |
| Registration for | SS |
| Paper # | SS2008-34 |
| Volume (vol) | vol.108 |
| Number (no) | no.242 |
| Page | pp.43-48 |
| #Pages | 6 |
| Date of Issue | 2008-10-09 (SS) |
[Return to Top Page]