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Paper Abstract and Keywords
Presentation 2009-01-16 11:45
Mesa-gate AlGaN/GaN HEMT having nano-width channels
Kota Ohi, Tamotsu Hashizume (Hokkaido Univ.) ED2008-223 MW2008-188 Link to ES Tech. Rep. Archives: ED2008-223 MW2008-188
Abstract (in Japanese) (See Japanese page) 
(in English) The surrounding field effect was effectively observed in a multi-mesa channel (MMC) using an AlGaN/GaN structure, where a periodic trench structure was fabricated just under a gate electrode. This resulted in the shallower threshold voltage, the lower sub-threshold slope and higher current drivability, as compared to a standard planar-type HEMT. In addition, the MMC HEMT showed a low knee voltage even in a long spacing between the gate and drain electrodes, which is required for the high-blocking voltage operation of power switching transistors. We also observed an excellent current stability in a saturation region in the MMC device, probably due to an effective radiation of heat from both mesa sides of channel. Both planar and MMC devices showed similar drain leakage characteristics and breakdown voltages under off-state operation, indicating no significant degradation on the break down characteristics in AlGaN/GaN HEMTs even when a periodic trench structure is applied to a gate region.
Keyword (in Japanese) (See Japanese page) 
(in English) GaN / AlGaN / High Electron Mobility Transistor(HEMT) / Multi-Mesa-Channel(MMC) structure / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 376, ED2008-223, pp. 141-144, Jan. 2009.
Paper # ED2008-223 
Date of Issue 2009-01-07 (ED, MW) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF ED2008-223 MW2008-188 Link to ES Tech. Rep. Archives: ED2008-223 MW2008-188

Conference Information
Committee MW ED  
Conference Date 2009-01-14 - 2009-01-16 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Compound Semiconductor ICs, High-speed and high-frequency devices 
Paper Information
Registration To ED 
Conference Code 2009-01-MW-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Mesa-gate AlGaN/GaN HEMT having nano-width channels 
Sub Title (in English)  
Keyword(1) GaN  
Keyword(2) AlGaN  
Keyword(3) High Electron Mobility Transistor(HEMT)  
Keyword(4) Multi-Mesa-Channel(MMC) structure  
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1st Author's Name Kota Ohi  
1st Author's Affiliation Hokkaido University (Hokkaido Univ.)
2nd Author's Name Tamotsu Hashizume  
2nd Author's Affiliation Hokkaido University (Hokkaido Univ.)
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Speaker Author-1 
Date Time 2009-01-16 11:45:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2008-223, MW2008-188 
Volume (vol) vol.108 
Number (no) no.376(ED), no.377(MW) 
Page pp.141-144 
#Pages
Date of Issue 2009-01-07 (ED, MW) 


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