| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2009-03-06 16:35 Growth Law of the Oxide Film Formed on the Tin Plated Contact Surface and Its Contact Resistance Characteristic -- Ellipsometric Study -- Yuya Nabeta, Terutaka Tamai, Yasushi Saitoh, Shigeru Sawada, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AN Technorogies)  EMD2008-146 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Tin plated contacts has been applied widely to electrical contacts of electromechanical devices as well as gold plated contacts. However, the tin plated surfsce covered with oxide film which is fundamentally different from gold plated surfaces. The oxide film prevents the surface from corrosion. When the film is interposed between contact interface, contact resistance increases. It is necessary to break down mechanically to obtain low contact resistance. However, detail study on the oxide film on the tin plated surface was not found in iteratures. Therefore, in the present study, for both 25℃ and 50℃ each other, growth law of the oxide film on the tin plated surface was found by measurement using ellipsometry for exposure to the atmoshere. Morover, the film thickness was identified by TEM. The results well sgreed with results obtained by the ellipsometry. As results, at 25℃, growth of the oxide film showed kinear law until 5nm in the initial stage of the exposure. In the second stage, oxide film indicated 1/4 law unitil 15nm. After this stage, the thickness growth saturated. For 50℃, growth law become increasesd in the initial stage, after this growth law showed same tendency at 25℃. The contact resistance indicated low constant value to 10nm in thickness. This low value is due to conduction mechanisms of thin film. Afer the thickness contact resistance increases to 5Ω. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | tin plating / oxide film / contact electromechanical devices / contact resistance / ellipsometry / SnO / / | |
| Reference Info. | IEICE Tech. Rep., vol. 108, no. 466, EMD2008-146, pp. 49-52, March 2009. | |
| Paper # | EMD2008-146 | |
| Date of Issue | 2009-02-27 (EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMD2008-146 |
|
| Conference Information | |
| Committee | EMD |
| Conference Date | 2009-03-06 - 2009-03-06 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kougakuin Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Short note (Graduation thesis and master's thesis) |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2009-03-EMD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Growth Law of the Oxide Film Formed on the Tin Plated Contact Surface and Its Contact Resistance Characteristic |
| Sub Title (in English) | Ellipsometric Study |
| Keyword(1) | tin plating |
| Keyword(2) | oxide film |
| Keyword(3) | contact electromechanical devices |
| Keyword(4) | contact resistance |
| Keyword(5) | ellipsometry |
| Keyword(6) | SnO |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Yuya Nabeta |
| 1st Author's Affiliation | Mie University (Mie Univ.) |
| 2nd Author's Name | Terutaka Tamai |
| 2nd Author's Affiliation | Mie University (Mie Univ.) |
| 3rd Author's Name | Yasushi Saitoh |
| 3rd Author's Affiliation | Mie University (Mie Univ.) |
| 4th Author's Name | Shigeru Sawada |
| 4th Author's Affiliation | Mie University (Mie Univ.) |
| 5th Author's Name | Kazuo Iida |
| 5th Author's Affiliation | Mie University (Mie Univ.) |
| 6th Author's Name | Yasuhiro Hattori |
| 6th Author's Affiliation | AutoNetworks Tchnologise, Ltd. (AN Technorogies) |
| Speaker | Author-1 |
| Date Time | 2009-03-06 16:35:00 |
| Presentation Time | 15 minutes |
| Registration for | EMD |
| Paper # | EMD2008-146 |
| Volume (vol) | vol.108 |
| Number (no) | no.466 |
| Page | pp.49-52 |
| #Pages | 4 |
| Date of Issue | 2009-02-27 (EMD) |
[Return to Top Page]