| Paper Abstract and Keywords |
| Presentation |
2009-05-22 10:00
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- Contact Resistance (V) -- Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.Ltd.), Koichiro Sawa (Keio Univ.) EMCJ2009-10 EMD2009-2 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
Authors developed the mechanism which gave real vibration to electrical contacts by hammering oscillation in the vertical direction, and studied the influences of a micro-oscillating on contact resistance.
First, they defined the mathematical model toward hammering oscillating mechanism and carried out theoretical approach by using solution methods for inverse problems. By delta function and step function as an external force, they have simply made modeling and simulation for the mechanism. It was suggested that the mechanism could make an acceleration test of actual degradation phenomenon on contacts by the influences of a micro-oscillation.
Second, they measured the fluctuations of the electrical contacts in the three conditions (150G & 2.0N, 150G & 0.3N and 400G & 2.0N). It was shown that the fluctuations were occurred in all cases but the time-series pattern of the fluctuation was different from each other in the points of contact resistance, starting number and so forth.
It should be considered more carefully that how is the phenomenon occurred to pay much more attentions to other factors like those of electrical, mechanical, physical and chemical factors. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
electrical contact / oscillating mechanism / contact resistance / hammering oscillating mechanism / acceleration test / mathematical model / simulation / time series fluctuation |
| Reference Info. |
IEICE Tech. Rep., vol. 109, no. 45, EMD2009-2, pp. 7-13, May 2009. |
| Paper # |
EMD2009-2 |
| Date of Issue |
2009-05-15 (EMCJ, EMD) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
EMCJ2009-10 EMD2009-2 |
| Conference Information |
| Committee |
EMD EMCJ |
| Conference Date |
2009-05-22 - 2009-05-22 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Kanda camupus, Nippon Institute of Technology |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Electrical discharge and EMC/general |
| Paper Information |
| Registration To |
EMD |
| Conference Code |
2009-05-EMD-EMCJ |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Degradation phenomenon of electrical contacts by hammering oscillating mechanism |
| Sub Title (in English) |
Contact Resistance (V) |
| Keyword(1) |
electrical contact |
| Keyword(2) |
oscillating mechanism |
| Keyword(3) |
contact resistance |
| Keyword(4) |
hammering oscillating mechanism |
| Keyword(5) |
acceleration test |
| Keyword(6) |
mathematical model |
| Keyword(7) |
simulation |
| Keyword(8) |
time series fluctuation |
| 1st Author's Name |
Shin-ichi Wada |
| 1st Author's Affiliation |
TMC System Co.Ltd. (TMC System Co.Ltd.) |
| 2nd Author's Name |
Taketo Sonoda |
| 2nd Author's Affiliation |
TMC System Co.Ltd. (TMC System Co.Ltd.) |
| 3rd Author's Name |
Keiji Koshida |
| 3rd Author's Affiliation |
TMC System Co.Ltd. (TMC System Co.Ltd.) |
| 4th Author's Name |
Mitsuo Kikuchi |
| 4th Author's Affiliation |
TMC System Co.Ltd. (TMC System Co.Ltd.) |
| 5th Author's Name |
Hiroaki Kubota |
| 5th Author's Affiliation |
TMC System Co.Ltd. (TMC System Co.Ltd.) |
| 6th Author's Name |
Koichiro Sawa |
| 6th Author's Affiliation |
Keio University K2 Campus, (Keio Univ.) |
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| Speaker |
Author-2 |
| Date Time |
2009-05-22 10:00:00 |
| Presentation Time |
25 minutes |
| Registration for |
EMD |
| Paper # |
EMCJ2009-10, EMD2009-2 |
| Volume (vol) |
vol.109 |
| Number (no) |
no.44(EMCJ), no.45(EMD) |
| Page |
pp.7-13 |
| #Pages |
7 |
| Date of Issue |
2009-05-15 (EMCJ, EMD) |