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Paper Abstract and Keywords
Presentation 2009-05-22 10:00
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (V) --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.Ltd.), Koichiro Sawa (Keio Univ.) EMCJ2009-10 EMD2009-2 Link to ES Tech. Rep. Archives: EMD2009-2
Abstract (in Japanese) (See Japanese page) 
(in English) Authors developed the mechanism which gave real vibration to electrical contacts by hammering oscillation in the vertical direction, and studied the influences of a micro-oscillating on contact resistance.
First, they defined the mathematical model toward hammering oscillating mechanism and carried out theoretical approach by using solution methods for inverse problems. By delta function and step function as an external force, they have simply made modeling and simulation for the mechanism. It was suggested that the mechanism could make an acceleration test of actual degradation phenomenon on contacts by the influences of a micro-oscillation.
Second, they measured the fluctuations of the electrical contacts in the three conditions (150G & 2.0N, 150G & 0.3N and 400G & 2.0N). It was shown that the fluctuations were occurred in all cases but the time-series pattern of the fluctuation was different from each other in the points of contact resistance, starting number and so forth.
It should be considered more carefully that how is the phenomenon occurred to pay much more attentions to other factors like those of electrical, mechanical, physical and chemical factors.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / oscillating mechanism / contact resistance / hammering oscillating mechanism / acceleration test / mathematical model / simulation / time series fluctuation  
Reference Info. IEICE Tech. Rep., vol. 109, no. 45, EMD2009-2, pp. 7-13, May 2009.
Paper # EMD2009-2 
Date of Issue 2009-05-15 (EMCJ, EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF EMCJ2009-10 EMD2009-2 Link to ES Tech. Rep. Archives: EMD2009-2

Conference Information
Committee EMD EMCJ  
Conference Date 2009-05-22 - 2009-05-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Kanda camupus, Nippon Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Electrical discharge and EMC/general 
Paper Information
Registration To EMD 
Conference Code 2009-05-EMD-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) Contact Resistance (V) 
Keyword(1) electrical contact  
Keyword(2) oscillating mechanism  
Keyword(3) contact resistance  
Keyword(4) hammering oscillating mechanism  
Keyword(5) acceleration test  
Keyword(6) mathematical model  
Keyword(7) simulation  
Keyword(8) time series fluctuation  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
2nd Author's Name Taketo Sonoda  
2nd Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
3rd Author's Name Keiji Koshida  
3rd Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
4th Author's Name Mitsuo Kikuchi  
4th Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
5th Author's Name Hiroaki Kubota  
5th Author's Affiliation TMC System Co.Ltd. (TMC System Co.Ltd.)
6th Author's Name Koichiro Sawa  
6th Author's Affiliation Keio University K2 Campus, (Keio Univ.)
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Speaker Author-2 
Date Time 2009-05-22 10:00:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMCJ2009-10, EMD2009-2 
Volume (vol) vol.109 
Number (no) no.44(EMCJ), no.45(EMD) 
Page pp.7-13 
#Pages
Date of Issue 2009-05-15 (EMCJ, EMD) 


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