Paper Abstract and Keywords |
Presentation |
2009-07-21 13:00
Investigation of characteristics with changing film thickness for Bi-2212/MgO fabricated by the MOD method Koji Hamanaka, Takashi Tachiki, Takashi Uchida (NDA) SCE2009-9 Link to ES Tech. Rep. Archives: SCE2009-9 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We have fabricated a Bi2Sr2CaCu2O8+x(Bi-2212) thin film on a MgO substrate by the metal-organic decomposition (MOD) method to apply the film to high frequency devices such as a terahertz oscillator and detector. However, in order to apply the film to devices flexibly, it is important to evaluate the characteristics of the film with changing the thickness. In this study, we optimized a firing condition for Bi-2212/MgO thin films with the thickness from 40 to 240 nm by MOD and investigated the characteristics of the films. As a result, for the film with about 120 nm fired at 840℃, a rotation angle = 45 deg was dominant. On the other hand, for the film with about 240 nm fired at 845℃, ~±12 deg. were dominant. When increasing the film thickness, a surface morphology improved, the resistivity at on-set Tc decreased, and the critical current density (Jc) increased. Jc was 4~5×105A/cm2 at 4.2K for the films with 120 and 240 nm. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Metal-organic decomposition(MOD)method / Bi-2212 thin films / MgO substrate / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 109, no. 141, SCE2009-9, pp. 1-6, July 2009. |
Paper # |
SCE2009-9 |
Date of Issue |
2009-07-14 (SCE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
SCE2009-9 Link to ES Tech. Rep. Archives: SCE2009-9 |
Conference Information |
Committee |
SCE |
Conference Date |
2009-07-21 - 2009-07-21 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Junctions and materials, etc. |
Paper Information |
Registration To |
SCE |
Conference Code |
2009-07-SCE |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Investigation of characteristics with changing film thickness for Bi-2212/MgO fabricated by the MOD method |
Sub Title (in English) |
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Keyword(1) |
Metal-organic decomposition(MOD)method |
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Bi-2212 thin films |
Keyword(3) |
MgO substrate |
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1st Author's Name |
Koji Hamanaka |
1st Author's Affiliation |
National Defense Academy (NDA) |
2nd Author's Name |
Takashi Tachiki |
2nd Author's Affiliation |
National Defense Academy (NDA) |
3rd Author's Name |
Takashi Uchida |
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National Defense Academy (NDA) |
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Speaker |
Author-1 |
Date Time |
2009-07-21 13:00:00 |
Presentation Time |
25 minutes |
Registration for |
SCE |
Paper # |
SCE2009-9 |
Volume (vol) |
vol.109 |
Number (no) |
no.141 |
Page |
pp.1-6 |
#Pages |
6 |
Date of Issue |
2009-07-14 (SCE) |
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