Paper Abstract and Keywords |
Presentation |
2009-10-02 09:35
Meta-Stable Characteristic of Single-Slope ADC with Time to Digital Convertor for CMOS-imager Sensor Shin Muon, Masayuki Ikebe, Junichi Motohisa, Eiichi Sano (Hokkaido Univ.) ICD2009-47 Link to ES Tech. Rep. Archives: ICD2009-47 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We have proposed the method of re-measuring quantizing error of Single-Slope ADC for CMOS imager with TDC (Time-to-Digital Converter). Here, we examined adding TDC by D-FF with multi-phase clock, vis-a-vis Delay-line TDC with CMOS inverters. For the operation at 200MHz using 0.25um process, we verified to compensate the process variation of process within 8%, and to operate TDC in DNL: ±0.25LSB, INL:± 0.4LSB by simulation. In addition, utilizing deformation thermo-code, we reduced D-FFs of TDC. For 12bit A/D Converter, when the first stage 9bit ADC and the second stage 3bit TDC are considered, we can design the proposed ADC with only 13 of D-FFs. The linearity of A/D Converter due to the jitter of PLL or DLL and the process variation. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Single-Slope ADC / Time to Digital Converter / Multi-Phase Clock / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 109, pp. 75-80, Oct. 2009. |
Paper # |
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Date of Issue |
2009-09-24 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2009-47 Link to ES Tech. Rep. Archives: ICD2009-47 |
Conference Information |
Committee |
ICD ITE-IST |
Conference Date |
2009-10-01 - 2009-10-02 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
CIC Tokyo (Tamachi) |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Analog, Mixed analog and digital, RF, and sensor interface circuitry |
Paper Information |
Registration To |
ITE-IST |
Conference Code |
2009-10-ICD-IST |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Meta-Stable Characteristic of Single-Slope ADC with Time to Digital Convertor for CMOS-imager Sensor |
Sub Title (in English) |
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Keyword(1) |
Single-Slope ADC |
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Time to Digital Converter |
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Multi-Phase Clock |
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1st Author's Name |
Shin Muon |
1st Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
2nd Author's Name |
Masayuki Ikebe |
2nd Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
3rd Author's Name |
Junichi Motohisa |
3rd Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
4th Author's Name |
Eiichi Sano |
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Hokkaido University (Hokkaido Univ.) |
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Speaker |
Author-1 |
Date Time |
2009-10-02 09:35:00 |
Presentation Time |
25 minutes |
Registration for |
ITE-IST |
Paper # |
ICD2009-47 |
Volume (vol) |
vol.109 |
Number (no) |
no.214 |
Page |
pp.75-80 |
#Pages |
6 |
Date of Issue |
2009-09-24 (ICD) |
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