IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2009-11-19 17:00
Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism -- Contact Resistance(VIII) --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Saindaa Norovling, Mitsuo Kikuchi, Hiroaki Kubota (TMC System), Koichiro Sawa (Keio Univ.) EMD2009-85 Link to ES Tech. Rep. Archives: EMD2009-85
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studied the influences of a micro-oscillating on the contacts. They measured fluctuations of resistances in the three conditions (150G for acceleration and 2.0N for contact force, 150G & 0.3N and 400G & 2.0N). It was shown that the fluctuations were occurred in all cases but the time-series pattern was different from one another in contact resistance, starting number and scratched slits. It should be considered more carefully how are the phenomenon occurred to pay more attentions to other factors like voltage and current.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / hammering oscillation mechanism / contact resistance / acceleration / displacement / contact force / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 287, EMD2009-85, pp. 71-74, Nov. 2009.
Paper # EMD2009-85 
Date of Issue 2009-11-12 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2009-85 Link to ES Tech. Rep. Archives: EMD2009-85

Conference Information
Committee EMD  
Conference Date 2009-11-19 - 2009-11-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Nippon Institute of Technology, Kanda Campus, Tokyo, Japan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) IS-EMD2009 (9th International Session on Electro-Mechanical Devices) 
Paper Information
Registration To EMD 
Conference Code 2009-11-EMD 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism 
Sub Title (in English) Contact Resistance(VIII) 
Keyword(1) electrical contact  
Keyword(2) hammering oscillation mechanism  
Keyword(3) contact resistance  
Keyword(4) acceleration  
Keyword(5) displacement  
Keyword(6) contact force  
Keyword(7)  
Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co.Ltd. (TMC System)
2nd Author's Name Taketo Sonoda  
2nd Author's Affiliation TMC System Co.Ltd. (TMC System)
3rd Author's Name Keiji Koshida  
3rd Author's Affiliation TMC System Co.Ltd. (TMC System)
4th Author's Name Saindaa Norovling  
4th Author's Affiliation TMC System Co.Ltd. (TMC System)
5th Author's Name Mitsuo Kikuchi  
5th Author's Affiliation TMC System Co.Ltd. (TMC System)
6th Author's Name Hiroaki Kubota  
6th Author's Affiliation TMC System Co.Ltd. (TMC System)
7th Author's Name Koichiro Sawa  
7th Author's Affiliation Keio University. (Keio Univ.)
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2009-11-19 17:00:00 
Presentation Time 20 minutes 
Registration for EMD 
Paper # EMD2009-85 
Volume (vol) vol.109 
Number (no) no.287 
Page pp.71-74 
#Pages
Date of Issue 2009-11-12 (EMD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan