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Paper Abstract and Keywords
Presentation 2010-01-21 13:15
Estimation of Complex Dielectric Constant in High Frequency by using Scattering Wave
Takashi Komakine, Takahiro Kurosawa (Akita Prefectural R&D Center), Hiroshi Inoue (Akita Univ.) EMCJ2009-104
Abstract (in Japanese) (See Japanese page) 
(in English) The dielectric is one of the most important materials for electric devices. To evaluate the permittivity for high frequency signal, several measurement systems have been practically developed. The scattering method can easily estimates the permittivity of the dielectric of which size can be small in comparison with the wave length. In this paper, the relationship between the scattering field strength and the permittivity of the dielectric scatterer is theoretically analyzed, and the formulation was denoted quantitatively. Additionally, the polarizability for a cube and a cylinder was investigated to compensate the shape effect of the specimen. Their correction factors against the spherical value were calculated within 30% larger. Moreover, a new frequency domain method using the scattering wave was proposed to estimate the dielectric loss. The method could measure the phase shift of the scattering wave caused by the polarization delay with high sensitivity.
Keyword (in Japanese) (See Japanese page) 
(in English) permittivity / high frequency permittivity / complex dielectric constant / scatterer / modulated scatterer / dielectric / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 370, EMCJ2009-104, pp. 37-40, Jan. 2010.
Paper # EMCJ2009-104 
Date of Issue 2010-01-14 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2010-01-21 - 2010-01-22 
Place (in Japanese) (See Japanese page) 
Place (in English) University of the Ryukyus 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2010-01-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Estimation of Complex Dielectric Constant in High Frequency by using Scattering Wave 
Sub Title (in English)  
Keyword(1) permittivity  
Keyword(2) high frequency permittivity  
Keyword(3) complex dielectric constant  
Keyword(4) scatterer  
Keyword(5) modulated scatterer  
Keyword(6) dielectric  
Keyword(7)  
Keyword(8)  
1st Author's Name Takashi Komakine  
1st Author's Affiliation Akita Prefectural R&D Center (Akita Prefectural R&D Center)
2nd Author's Name Takahiro Kurosawa  
2nd Author's Affiliation Akita Prefectural R&D Center (Akita Prefectural R&D Center)
3rd Author's Name Hiroshi Inoue  
3rd Author's Affiliation Akita University (Akita Univ.)
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Speaker Author-1 
Date Time 2010-01-21 13:15:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2009-104 
Volume (vol) vol.109 
Number (no) no.370 
Page pp.37-40 
#Pages 4 
Date of Issue 2010-01-14 (EMCJ) 

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