Paper Abstract and Keywords |
Presentation |
2010-01-22 14:20
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- Contact Resistance (XI) -- Shin-ichi Wada, Saindaa Norovling, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co., Ltd.,), Koichiro Sawa (Professor Emeritus of Keio Univ./Nippon Inst. of Tech.) EMD2009-114 Link to ES Tech. Rep. Archives: EMD2009-114 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Authors developed the mechanism which gave real vibration to electrical contacts by hammering oscillation in the vertical direction, and studied the influences of a micro-oscillating on contact resistance. By delta function and step function as an external force, they have simply made modeling and simulation for the mechanism. It was suggested that the mechanism could make an acceleration test of actual degradation phenomenon on contacts by the influences of a micro-oscillation. In this paper in addition to Condition1 (150G & 2.0N) Condition2 (150G & 0.3N), they measured the fluctuations of the electrical contacts in the three Condition3 (400G & 2.0N). It was shown that the fluctuations were occurred in all cases but the time-series pattern of the fluctuation was different from each other in the points of contact resistance, starting number and so forth. It should be considered more carefully that how is the phenomenon occurred to pay much more attentions to other factors like those of electrical, mechanical, physical and chemical factors. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
electrical contact / contact resistance / hammering oscillating mechanism / acceleration / time series fluctuation / / / |
Reference Info. |
IEICE Tech. Rep., vol. 109, no. 385, EMD2009-114, pp. 11-16, Jan. 2010. |
Paper # |
EMD2009-114 |
Date of Issue |
2010-01-15 (EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
EMD2009-114 Link to ES Tech. Rep. Archives: EMD2009-114 |
Conference Information |
Committee |
EMD |
Conference Date |
2010-01-22 - 2010-01-22 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Rental Hall Shonan Hiratsuka |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
General |
Paper Information |
Registration To |
EMD |
Conference Code |
2010-01-EMD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Degradation phenomenon of electrical contacts by hammering oscillating mechanism |
Sub Title (in English) |
Contact Resistance (XI) |
Keyword(1) |
electrical contact |
Keyword(2) |
contact resistance |
Keyword(3) |
hammering oscillating mechanism |
Keyword(4) |
acceleration |
Keyword(5) |
time series fluctuation |
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1st Author's Name |
Shin-ichi Wada |
1st Author's Affiliation |
TMC System Co., Ltd., (TMC System Co., Ltd.,) |
2nd Author's Name |
Saindaa Norovling |
2nd Author's Affiliation |
TMC System Co., Ltd., (TMC System Co., Ltd.,) |
3rd Author's Name |
Taketo Sonoda |
3rd Author's Affiliation |
TMC System Co., Ltd., (TMC System Co., Ltd.,) |
4th Author's Name |
Keiji Koshida |
4th Author's Affiliation |
TMC System Co., Ltd., (TMC System Co., Ltd.,) |
5th Author's Name |
Mitsuo Kikuchi |
5th Author's Affiliation |
TMC System Co., Ltd., (TMC System Co., Ltd.,) |
6th Author's Name |
Hiroaki Kubota |
6th Author's Affiliation |
TMC System Co., Ltd., (TMC System Co., Ltd.,) |
7th Author's Name |
Koichiro Sawa |
7th Author's Affiliation |
Professor Emeritus of Keio University/Nippon Institute of Technology (Professor Emeritus of Keio Univ./Nippon Inst. of Tech.) |
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Speaker |
Author-2 |
Date Time |
2010-01-22 14:20:00 |
Presentation Time |
25 minutes |
Registration for |
EMD |
Paper # |
EMD2009-114 |
Volume (vol) |
vol.109 |
Number (no) |
no.385 |
Page |
pp.11-16 |
#Pages |
6 |
Date of Issue |
2010-01-15 (EMD) |
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