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Paper Abstract and Keywords
Presentation 2010-01-22 14:20
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (XI) --
Shin-ichi Wada, Saindaa Norovling, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co., Ltd.,), Koichiro Sawa (Professor Emeritus of Keio Univ./Nippon Inst. of Tech.) EMD2009-114 Link to ES Tech. Rep. Archives: EMD2009-114
Abstract (in Japanese) (See Japanese page) 
(in English) Authors developed the mechanism which gave real vibration to electrical contacts by hammering oscillation in the vertical direction, and studied the influences of a micro-oscillating on contact resistance. By delta function and step function as an external force, they have simply made modeling and simulation for the mechanism. It was suggested that the mechanism could make an acceleration test of actual degradation phenomenon on contacts by the influences of a micro-oscillation. In this paper in addition to Condition1 (150G & 2.0N) Condition2 (150G & 0.3N), they measured the fluctuations of the electrical contacts in the three Condition3 (400G & 2.0N). It was shown that the fluctuations were occurred in all cases but the time-series pattern of the fluctuation was different from each other in the points of contact resistance, starting number and so forth. It should be considered more carefully that how is the phenomenon occurred to pay much more attentions to other factors like those of electrical, mechanical, physical and chemical factors.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / contact resistance / hammering oscillating mechanism / acceleration / time series fluctuation / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 385, EMD2009-114, pp. 11-16, Jan. 2010.
Paper # EMD2009-114 
Date of Issue 2010-01-15 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2009-114 Link to ES Tech. Rep. Archives: EMD2009-114

Conference Information
Committee EMD  
Conference Date 2010-01-22 - 2010-01-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Rental Hall Shonan Hiratsuka 
Topics (in Japanese) (See Japanese page) 
Topics (in English) General 
Paper Information
Registration To EMD 
Conference Code 2010-01-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) Contact Resistance (XI) 
Keyword(1) electrical contact  
Keyword(2) contact resistance  
Keyword(3) hammering oscillating mechanism  
Keyword(4) acceleration  
Keyword(5) time series fluctuation  
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1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co., Ltd., (TMC System Co., Ltd.,)
2nd Author's Name Saindaa Norovling  
2nd Author's Affiliation TMC System Co., Ltd., (TMC System Co., Ltd.,)
3rd Author's Name Taketo Sonoda  
3rd Author's Affiliation TMC System Co., Ltd., (TMC System Co., Ltd.,)
4th Author's Name Keiji Koshida  
4th Author's Affiliation TMC System Co., Ltd., (TMC System Co., Ltd.,)
5th Author's Name Mitsuo Kikuchi  
5th Author's Affiliation TMC System Co., Ltd., (TMC System Co., Ltd.,)
6th Author's Name Hiroaki Kubota  
6th Author's Affiliation TMC System Co., Ltd., (TMC System Co., Ltd.,)
7th Author's Name Koichiro Sawa  
7th Author's Affiliation Professor Emeritus of Keio University/Nippon Institute of Technology (Professor Emeritus of Keio Univ./Nippon Inst. of Tech.)
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Speaker Author-2 
Date Time 2010-01-22 14:20:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2009-114 
Volume (vol) vol.109 
Number (no) no.385 
Page pp.11-16 
#Pages
Date of Issue 2010-01-15 (EMD) 


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