Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2010-02-15 15:40
High Speed X-Fault Diagnosis with Partial X-Resolution
Kohei Miyase (Kyushu Inst. of Tech.), Yusuke Nakamura (Panasonic Communications Software Co.,Ltd.), Yuta Yamato, Xiaoqing Wen, Seiji Kajihara (Kyushu Inst. of Tech.) DC2009-76
Abstract (in Japanese) (See Japanese page) 
(in English) Defects behavior of ultra small size and high speed LSI is getting complicated. It makes localization of fault site and analysis of the cause of fault more difficult. X-fault model can represent various combinations of faulty values. Fault diagnosis with X-fault model can more accurately locate the fault site than one with conventional stuck-at fault model. However, computation time for X-fault simulation in the diagnosis becomes larger. In this paper, we propose a method to reduce computation time for X-fault simulation by pruning unnecessary simulation vectors. In the experimental results, the proposed method can reduce computation time for X-fault simulation without degradation of diagnosis results.
Keyword (in Japanese) (See Japanese page) 
(in English) Fault diagnosis / Localization of fault site / X-fault model / fault simulation / / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 416, DC2009-76, pp. 69-74, Feb. 2010.
Paper # DC2009-76 
Date of Issue 2010-02-08 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2009-76

Conference Information
Committee DC  
Conference Date 2010-02-15 - 2010-02-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2010-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) High Speed X-Fault Diagnosis with Partial X-Resolution 
Sub Title (in English)  
Keyword(1) Fault diagnosis  
Keyword(2) Localization of fault site  
Keyword(3) X-fault model  
Keyword(4) fault simulation  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kohei Miyase  
1st Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
2nd Author's Name Yusuke Nakamura  
2nd Author's Affiliation Panasonic Communications Software Co.,Ltd. (Panasonic Communications Software Co.,Ltd.)
3rd Author's Name Yuta Yamato  
3rd Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
4th Author's Name Xiaoqing Wen  
4th Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
5th Author's Name Seiji Kajihara  
5th Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2010-02-15 15:40:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2009-76 
Volume (vol) vol.109 
Number (no) no.416 
Page pp.69-74 
#Pages 6 
Date of Issue 2010-02-08 (DC) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan