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Paper Abstract and Keywords
Presentation 2010-02-15 09:00
A Statistical Method of Small Iddq Variance Outlier Detection
Yoshiyuki Nakamura, Masashi Tanaka (NEC Electronics) DC2009-65
Abstract (in Japanese) (See Japanese page) 
(in English) With manufacturing process advances, Iddq test becomes difficult due to its variance. Though ?Iddq or various methods were proposed to overcome it, Iddq testing is still difficult because the factor of Iddq variance is increasing and the most of faults affect only small Iddq differences. In this paper, we propose Iddq testing using Mahalanobis distance to identify outliers of multi-dimensional Iddq variance. We also report the evaluation results of our method using real manufacturing data.
Keyword Iddq test，Statistical test, adaptive test, Mahalanobis distance
Keyword (in Japanese) (See Japanese page) 
(in English) Iddq test / Statistical test / adaptive test / Mahalanobis distance / / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 416, DC2009-65, pp. 1-5, Feb. 2010.
Paper # DC2009-65 
Date of Issue 2010-02-08 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2009-65

Conference Information
Committee DC  
Conference Date 2010-02-15 - 2010-02-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2010-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Statistical Method of Small Iddq Variance Outlier Detection 
Sub Title (in English)  
Keyword(1) Iddq test  
Keyword(2) Statistical test  
Keyword(3) adaptive test  
Keyword(4) Mahalanobis distance  
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1st Author's Name Yoshiyuki Nakamura  
1st Author's Affiliation NEC Electronics corporation (NEC Electronics)
2nd Author's Name Masashi Tanaka  
2nd Author's Affiliation NEC Electronics corporation (NEC Electronics)
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Speaker Author-1 
Date Time 2010-02-15 09:00:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2009-65 
Volume (vol) vol.109 
Number (no) no.416 
Page pp.1-5 
#Pages 5 
Date of Issue 2010-02-08 (DC) 

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