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Paper Abstract and Keywords
Presentation 2010-03-12 10:25
Performance evaluation of ADDER with Error-Detection-Correction Mechanism
Yuuta Ukon (Osaka Univ), Masafumi Inoue (Tokyo Inst. of Tech.), Atsushi Takahashi, Kenji Taniguchi (Osaka Univ) VLD2009-121
Abstract (in Japanese) (See Japanese page) 
(in English) In complete-synchronous framework that is adopted as de facto standard in clock-synchronous circuit design, the maximum delay between Flip-Flops gives a lower bound of clock period. Therefore, the reduction of the maximum delay between Flip-Flops is pursued, but it approaches the limit. In this paper, we focus on the fact that the maximum delay varies depending on the input signal pattern, and introduce an error-detection-correction mechanism that enables a circuit to work with clock period which is less than the maximum delay. In order to confirm the effect of error-detection-correction mechanism, we evaluate the delay error rate of an adder and confirm that the effective clock period of the adder is reduced by introducing error-detection-correction mechanism.
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Keyword (in Japanese) (See Japanese page) 
(in English) Error-detection-correction mechanism / delay time / hold time / delay error rate / hold error rate / effective clock period / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 462, VLD2009-121, pp. 133-137, March 2010.
Paper # VLD2009-121 
Date of Issue 2010-03-03 (VLD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee VLD  
Conference Date 2010-03-10 - 2010-03-12 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Technology for System-on-Silicon 
Paper Information
Registration To VLD 
Conference Code 2010-03-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Performance evaluation of ADDER with Error-Detection-Correction Mechanism 
Sub Title (in English)  
Keyword(1) Error-detection-correction mechanism  
Keyword(2) delay time  
Keyword(3) hold time  
Keyword(4) delay error rate  
Keyword(5) hold error rate  
Keyword(6) effective clock period  
Keyword(7)  
Keyword(8)  
1st Author's Name Yuuta Ukon  
1st Author's Affiliation Osaka University (Osaka Univ)
2nd Author's Name Masafumi Inoue  
2nd Author's Affiliation Tokyo Institute of Technology (Tokyo Inst. of Tech.)
3rd Author's Name Atsushi Takahashi  
3rd Author's Affiliation Osaka University (Osaka Univ)
4th Author's Name Kenji Taniguchi  
4th Author's Affiliation Osaka University (Osaka Univ)
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Speaker Author-1 
Date Time 2010-03-12 10:25:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2009-121 
Volume (vol) vol.109 
Number (no) no.462 
Page pp.133-137 
#Pages
Date of Issue 2010-03-03 (VLD) 


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