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Paper Abstract and Keywords
Presentation 2010-04-22 09:50
[Invited Talk] Challenging for an ultra low-voltage SRAM by innovative design circuits and device technologies -- A 0.5V 100MHz PD-SOI SRAM using Asymmetric MOSFET and Forward Body Bias --
Koji Nii, Makoto Yabuuchi, Yasumasa Tsukamoto, Yuuichi Hirano, Toshiaki Iwamatsu, Yuji Kihara (Renesas Electronics) ICD2010-2 Link to ES Tech. Rep. Archives: ICD2010-2
Abstract (in Japanese) (See Japanese page) 
(in English) We investigate 0.5V 6T-SRAM with asymmetric MOSFET, which contributes to enhance the read and write margin. We also introduce a forward body bias technique not only bitcell arrays but also peripheral circuits. Test chips are designed and fabricated using 90-nm PD-SOI technology. The measurement results show minimum operating voltage of proposed SRAM was 0.45V at 25 C, which is 100mV lower than conventional SRAM, and the access time was 6.8ns at 0.5V.
Keyword (in Japanese) (See Japanese page) 
(in English) SRAM / Low-power / SOI / VCCmin / Asymmetric / Forward Body Bias / Halo / 0.5V  
Reference Info. IEICE Tech. Rep., vol. 110, no. 9, ICD2010-2, pp. 7-12, April 2010.
Paper # ICD2010-2 
Date of Issue 2010-04-15 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2010-2 Link to ES Tech. Rep. Archives: ICD2010-2

Conference Information
Committee ICD  
Conference Date 2010-04-22 - 2010-04-23 
Place (in Japanese) (See Japanese page) 
Place (in English) Shonan Institute of Tech. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Memory Device Technologies 
Paper Information
Registration To ICD 
Conference Code 2010-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Challenging for an ultra low-voltage SRAM by innovative design circuits and device technologies 
Sub Title (in English) A 0.5V 100MHz PD-SOI SRAM using Asymmetric MOSFET and Forward Body Bias 
Keyword(1) SRAM  
Keyword(2) Low-power  
Keyword(3) SOI  
Keyword(4) VCCmin  
Keyword(5) Asymmetric  
Keyword(6) Forward Body Bias  
Keyword(7) Halo  
Keyword(8) 0.5V  
1st Author's Name Koji Nii  
1st Author's Affiliation Renesas Electronics (Renesas Electronics)
2nd Author's Name Makoto Yabuuchi  
2nd Author's Affiliation Renesas Electronics (Renesas Electronics)
3rd Author's Name Yasumasa Tsukamoto  
3rd Author's Affiliation Renesas Electronics (Renesas Electronics)
4th Author's Name Yuuichi Hirano  
4th Author's Affiliation Renesas Electronics (Renesas Electronics)
5th Author's Name Toshiaki Iwamatsu  
5th Author's Affiliation Renesas Electronics (Renesas Electronics)
6th Author's Name Yuji Kihara  
6th Author's Affiliation Renesas Electronics (Renesas Electronics)
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Speaker Author-1 
Date Time 2010-04-22 09:50:00 
Presentation Time 50 minutes 
Registration for ICD 
Paper # ICD2010-2 
Volume (vol) vol.110 
Number (no) no.9 
Page pp.7-12 
#Pages
Date of Issue 2010-04-15 (ICD) 


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