Paper Abstract and Keywords |
Presentation |
2010-07-22 10:20
An Integrated Cryogenic Current Comparator Michitaka Maruyama, Chiharu Urano, Takehiko Oe, Masaaki Maezawa, Takahiro Yamada (AIST), Mutsuo Hidaka, Tetsuro Satoh, Shuichi Nagasawa, Kenji Hinode (ISTEC), Nobu-hisa Kaneko (AIST) SCE2010-16 Link to ES Tech. Rep. Archives: SCE2010-16 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We propose a small cryogenic current comparator (CCC) using a superconducting integrated circuit technology. Conventional CCCs, which are widely used for high-precision electrical measurements, are usually made with lead bulk, and have the sizes of the order of several to more than ten centimeters. Such the hand-made CCCs require a special skill for their fabrication and liquid helium cooling for their operation. Additionally, they have some problems in durability and reliability due to mechanically soft lead material. In actual measurements, data is easily affected by vibration. The three dimensional structure of CCC is rather complex; it was not realized by normal superconductor thin-film processes. If we could make a CCC with a thin-film structure using a multilayer process which was originally developed for fabricating superconducting integrated circuits, a small-size integrated CCC (ICCC), which can be cooled with a compact cryocooler, with high reliability and increased functions will be realized. This paper proposes the basis, the design and fabrication of the ICCC, shows some experimental results, and discusses prospective views. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Superconductor / Cryogenic Current Comparator / Multilayer Process / Precision Measurement / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 139, SCE2010-16, pp. 13-18, July 2010. |
Paper # |
SCE2010-16 |
Date of Issue |
2010-07-15 (SCE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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SCE2010-16 Link to ES Tech. Rep. Archives: SCE2010-16 |
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