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Paper Abstract and Keywords
Presentation 2010-08-27 16:20
Surface plasmon enhanced light detection using free electron in metal
Makoto Tohyama, Takuma Aihara, Kyouhei Nakagawa, Kenzo Yamaguchi, Mitsuo Fukuda (Toyohashi Univ. of Tech.) EMD2010-58 CPM2010-74 OPE2010-83 LQE2010-56
Abstract (in Japanese) (See Japanese page) 
(in English) Photonic devices employing surface plasmons and optical near field are being actively developed as components of new opto-electronic integrated circuit in many laboratories because these devices are possibly with high density integrated beyond the diffraction limit of light. A schottky-type light detector composed of metal and semiconductor has been fabricated and demonstrated for development of light detector employing surface plasmons. Free electrons in metal were directly excited by incident light and detected as photocurrent. This excitation was enhanced by localized surface plasmon induced at the metal nanorods attached to the metal. These experimental results indicate the feasibility of surface plasmon detector using schottky-junction and metal nanorods.
Keyword (in Japanese) (See Japanese page) 
(in English) Surface plasmon / Photodiode / Metal nanorods / Schottky junction / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 180, OPE2010-83, pp. 149-152, Aug. 2010.
Paper # OPE2010-83 
Date of Issue 2010-08-19 (EMD, CPM, OPE, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2010-58 CPM2010-74 OPE2010-83 LQE2010-56

Conference Information
Committee EMD OPE LQE CPM  
Conference Date 2010-08-26 - 2010-08-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Chitose Arcadia Plaza 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To OPE 
Conference Code 2010-08-EMD-OPE-LQE-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Surface plasmon enhanced light detection using free electron in metal 
Sub Title (in English)  
Keyword(1) Surface plasmon  
Keyword(2) Photodiode  
Keyword(3) Metal nanorods  
Keyword(4) Schottky junction  
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1st Author's Name Makoto Tohyama  
1st Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Tech.)
2nd Author's Name Takuma Aihara  
2nd Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Tech.)
3rd Author's Name Kyouhei Nakagawa  
3rd Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Tech.)
4th Author's Name Kenzo Yamaguchi  
4th Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Tech.)
5th Author's Name Mitsuo Fukuda  
5th Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Tech.)
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Speaker Author-1 
Date Time 2010-08-27 16:20:00 
Presentation Time 25 minutes 
Registration for OPE 
Paper # EMD2010-58, CPM2010-74, OPE2010-83, LQE2010-56 
Volume (vol) vol.110 
Number (no) no.178(EMD), no.179(CPM), no.180(OPE), no.181(LQE) 
Page pp.149-152 
#Pages 4 
Date of Issue 2010-08-19 (EMD, CPM, OPE, LQE) 

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