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Paper Abstract and Keywords
Presentation 2010-10-05 13:40
Pattern Layout Methods of System LSI with SGT
Takahiro Kodama, Shigeyoshi Watanabe (SIT) SIP2010-56 ICD2010-70 IE2010-74
Abstract (in Japanese) (See Japanese page) 
(in English) The pattern area reduction of inverter, NAND, and full adder with SGT and stacked SGT has been ‘newly’ estimated. Wring SGT and stacked SGT the pattern area can be drastically reduced compared with that of conventional planar transistor, SGT and stacked SGT are promising candidate for reeling high density system LSI.
Keyword (in Japanese) (See Japanese page) 
(in English) SGT / stacked SGT / system LSI / design rule / pattern area / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 216, ICD2010-70, pp. 43-48, Oct. 2010.
Paper # ICD2010-70 
Date of Issue 2010-09-28 (SIP, ICD, IE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SIP2010-56 ICD2010-70 IE2010-74

Conference Information
Committee IPSJ-SLDM SIP IE ICD  
Conference Date 2010-10-05 - 2010-10-06 
Place (in Japanese) (See Japanese page) 
Place (in English) Makuhari Messe, International Conference Hall 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Frontier of processor, DSP, and image processing supporting Digital Harmony 
Paper Information
Registration To ICD 
Conference Code 2010-10-SLDM-SIP-IE-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Pattern Layout Methods of System LSI with SGT 
Sub Title (in English)  
Keyword(1) SGT  
Keyword(2) stacked SGT  
Keyword(3) system LSI  
Keyword(4) design rule  
Keyword(5) pattern area  
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Keyword(8)  
1st Author's Name Takahiro Kodama  
1st Author's Affiliation Shonan Institute of Technology (SIT)
2nd Author's Name Shigeyoshi Watanabe  
2nd Author's Affiliation Shonan Institute of Technology (SIT)
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Speaker Author-1 
Date Time 2010-10-05 13:40:00 
Presentation Time 20 minutes 
Registration for ICD 
Paper # SIP2010-56, ICD2010-70, IE2010-74 
Volume (vol) vol.110 
Number (no) no.215(SIP), no.216(ICD), no.217(IE) 
Page pp.43-48 
#Pages 6 
Date of Issue 2010-09-28 (SIP, ICD, IE) 

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