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Paper Abstract and Keywords
Presentation 2010-11-12 13:50
Modeling of Single-Event-Transient Pulse Generation in Inverter Cells
Katsuhiko Tanaka, Hideyuki Nakamura, Taiki Uemura, Kan Takeuchi, Toshikazu Fukuda, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete) SDM2010-180
Abstract (in Japanese) (See Japanese page) 
(in English) Soft errors in logic circuits due to the propagation of erroneous signal caused by ionized particle generated by cosmic neutrons, which is called Single Event Transient (SET), might degrade reliability of future LSIs. A calculation model for estimating SET pulse width observed in inverter cells is proposed, which utilizes waveform of charge collection current obtained for single MOSFET structure. This method does not require SPICE, and a small number of TCAD calculations that should be performed beforehand to store current waveforms is sufficient. Calculated pulse widths agree well with those obtained by mixed-mode TCAD simulations, in general. This method is applied to calculation of distribution of SET pulse generation rate, and to evaluation of error rate in chip level, and it is predicted that some remedies for logic soft errors might be necessary around 40nm node for applications that requires high reliability.
Keyword (in Japanese) (See Japanese page) 
(in English) soft error / Single Event Transient / combinational logic / neutron / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 274, SDM2010-180, pp. 47-52, Nov. 2010.
Paper # SDM2010-180 
Date of Issue 2010-11-04 (SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee SDM  
Conference Date 2010-11-11 - 2010-11-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Process, Device, Circuit Simulations, etc 
Paper Information
Registration To SDM 
Conference Code 2010-11-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Modeling of Single-Event-Transient Pulse Generation in Inverter Cells 
Sub Title (in English)  
Keyword(1) soft error  
Keyword(2) Single Event Transient  
Keyword(3) combinational logic  
Keyword(4) neutron  
Keyword(5)  
Keyword(6)  
Keyword(7)  
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1st Author's Name Katsuhiko Tanaka  
1st Author's Affiliation MIRAI-Selete (MIRAI-Selete)
2nd Author's Name Hideyuki Nakamura  
2nd Author's Affiliation MIRAI-Selete (MIRAI-Selete)
3rd Author's Name Taiki Uemura  
3rd Author's Affiliation MIRAI-Selete (MIRAI-Selete)
4th Author's Name Kan Takeuchi  
4th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
5th Author's Name Toshikazu Fukuda  
5th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
6th Author's Name Shigetaka Kumashiro  
6th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
7th Author's Name Tohru Mogami  
7th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
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Speaker Author-1 
Date Time 2010-11-12 13:50:00 
Presentation Time 25 minutes 
Registration for SDM 
Paper # SDM2010-180 
Volume (vol) vol.110 
Number (no) no.274 
Page pp.47-52 
#Pages 6 
Date of Issue 2010-11-04 (SDM) 

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