Paper Abstract and Keywords |
Presentation |
2010-11-12 13:50
Modeling of Single-Event-Transient Pulse Generation in Inverter Cells Katsuhiko Tanaka, Hideyuki Nakamura, Taiki Uemura, Kan Takeuchi, Toshikazu Fukuda, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete) SDM2010-180 Link to ES Tech. Rep. Archives: SDM2010-180 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Soft errors in logic circuits due to the propagation of erroneous signal caused by ionized particle generated by cosmic neutrons, which is called Single Event Transient (SET), might degrade reliability of future LSIs. A calculation model for estimating SET pulse width observed in inverter cells is proposed, which utilizes waveform of charge collection current obtained for single MOSFET structure. This method does not require SPICE, and a small number of TCAD calculations that should be performed beforehand to store current waveforms is sufficient. Calculated pulse widths agree well with those obtained by mixed-mode TCAD simulations, in general. This method is applied to calculation of distribution of SET pulse generation rate, and to evaluation of error rate in chip level, and it is predicted that some remedies for logic soft errors might be necessary around 40nm node for applications that requires high reliability. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
soft error / Single Event Transient / combinational logic / neutron / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 274, SDM2010-180, pp. 47-52, Nov. 2010. |
Paper # |
SDM2010-180 |
Date of Issue |
2010-11-04 (SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
SDM2010-180 Link to ES Tech. Rep. Archives: SDM2010-180 |
Conference Information |
Committee |
SDM |
Conference Date |
2010-11-11 - 2010-11-12 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Process, Device, Circuit Simulations, etc |
Paper Information |
Registration To |
SDM |
Conference Code |
2010-11-SDM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Modeling of Single-Event-Transient Pulse Generation in Inverter Cells |
Sub Title (in English) |
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Keyword(1) |
soft error |
Keyword(2) |
Single Event Transient |
Keyword(3) |
combinational logic |
Keyword(4) |
neutron |
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1st Author's Name |
Katsuhiko Tanaka |
1st Author's Affiliation |
MIRAI-Selete (MIRAI-Selete) |
2nd Author's Name |
Hideyuki Nakamura |
2nd Author's Affiliation |
MIRAI-Selete (MIRAI-Selete) |
3rd Author's Name |
Taiki Uemura |
3rd Author's Affiliation |
MIRAI-Selete (MIRAI-Selete) |
4th Author's Name |
Kan Takeuchi |
4th Author's Affiliation |
MIRAI-Selete (MIRAI-Selete) |
5th Author's Name |
Toshikazu Fukuda |
5th Author's Affiliation |
MIRAI-Selete (MIRAI-Selete) |
6th Author's Name |
Shigetaka Kumashiro |
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MIRAI-Selete (MIRAI-Selete) |
7th Author's Name |
Tohru Mogami |
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MIRAI-Selete (MIRAI-Selete) |
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Speaker |
Author-1 |
Date Time |
2010-11-12 13:50:00 |
Presentation Time |
25 minutes |
Registration for |
SDM |
Paper # |
SDM2010-180 |
Volume (vol) |
vol.110 |
Number (no) |
no.274 |
Page |
pp.47-52 |
#Pages |
6 |
Date of Issue |
2010-11-04 (SDM) |
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