講演抄録/キーワード |
講演名 |
2010-11-12 14:15
On a Contact Failure Prediction and Reliability of Electrical Contacts ○Zhiling Yu・Takahiro Ueno・Kenya Jin'no(Nippon Inst. of Tech.) EMD2010-115 エレソ技報アーカイブへのリンク:EMD2010-115 |
抄録 |
(和) |
(まだ登録されていません) |
(英) |
The contact devices are widely used in electrical circuits, and very important. For this reason, they are required high reliability. In this article, we propose a method which predicts a contact failure of electrical contacts and connector contacts. By using an experimental measurements and a numerical simulation of a current collecting under static contact conditions, we clarify a current collecting mechanism in the contact surface. We discuss the factors to generate such contact failure. Especially, we will clarify the relation between the contact failure and the shape of the peripheral part of the contact device.
Namely, if the pin has the conic shaped tip, the contact resistance is decreased with time. On the other hand, the pin has the semisphere shaped tip, the contact resistance is increased with time. Based on these facts, we predict the contact failure by using a three layered type artificial neural network system. Also, we discuss the reliability of the electrical contacts. |
キーワード |
(和) |
/ / / / / / / |
(英) |
electrical contacts / failure prediction / conic shaped tip / semisphere shaped tip / neural networks / backpropagation / / |
文献情報 |
信学技報, vol. 110, no. 270, EMD2010-115, pp. 201-204, 2010年11月. |
資料番号 |
EMD2010-115 |
発行日 |
2010-11-04 (EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
著作権に ついて |
技術研究報告に掲載された論文の著作権は電子情報通信学会に帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
PDFダウンロード |
EMD2010-115 エレソ技報アーカイブへのリンク:EMD2010-115 |
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