Paper Abstract and Keywords |
Presentation |
2010-11-12 14:15
On a Contact Failure Prediction and Reliability of Electrical Contacts Zhiling Yu, Takahiro Ueno, Kenya Jin'no (Nippon Inst. of Tech.) EMD2010-115 Link to ES Tech. Rep. Archives: EMD2010-115 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The contact devices are widely used in electrical circuits, and very important. For this reason, they are required high reliability. In this article, we propose a method which predicts a contact failure of electrical contacts and connector contacts. By using an experimental measurements and a numerical simulation of a current collecting under static contact conditions, we clarify a current collecting mechanism in the contact surface. We discuss the factors to generate such contact failure. Especially, we will clarify the relation between the contact failure and the shape of the peripheral part of the contact device.
Namely, if the pin has the conic shaped tip, the contact resistance is decreased with time. On the other hand, the pin has the semisphere shaped tip, the contact resistance is increased with time. Based on these facts, we predict the contact failure by using a three layered type artificial neural network system. Also, we discuss the reliability of the electrical contacts. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
electrical contacts / failure prediction / conic shaped tip / semisphere shaped tip / neural networks / backpropagation / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 270, EMD2010-115, pp. 201-204, Nov. 2010. |
Paper # |
EMD2010-115 |
Date of Issue |
2010-11-04 (EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
EMD2010-115 Link to ES Tech. Rep. Archives: EMD2010-115 |
Conference Information |
Committee |
EMD |
Conference Date |
2010-11-11 - 2010-11-12 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Xi'an Jiaotong University |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
IS-EMD2010 (10th International Session in Electro-Mechanical Devices) |
Paper Information |
Registration To |
EMD |
Conference Code |
2010-11-EMD |
Language |
English |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
On a Contact Failure Prediction and Reliability of Electrical Contacts |
Sub Title (in English) |
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Keyword(1) |
electrical contacts |
Keyword(2) |
failure prediction |
Keyword(3) |
conic shaped tip |
Keyword(4) |
semisphere shaped tip |
Keyword(5) |
neural networks |
Keyword(6) |
backpropagation |
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Keyword(8) |
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1st Author's Name |
Zhiling Yu |
1st Author's Affiliation |
Nippon Institute of Technology (Nippon Inst. of Tech.) |
2nd Author's Name |
Takahiro Ueno |
2nd Author's Affiliation |
Nippon Institute of Technology (Nippon Inst. of Tech.) |
3rd Author's Name |
Kenya Jin'no |
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Nippon Institute of Technology (Nippon Inst. of Tech.) |
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Speaker |
Author-1 |
Date Time |
2010-11-12 14:15:00 |
Presentation Time |
15 minutes |
Registration for |
EMD |
Paper # |
EMD2010-115 |
Volume (vol) |
vol.110 |
Number (no) |
no.270 |
Page |
pp.201-204 |
#Pages |
4 |
Date of Issue |
2010-11-04 (EMD) |
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