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Paper Abstract and Keywords
Presentation 2010-11-19 14:25
Performance Degradation of Photovoltaic Modules with Rapid Thermal-Cycling
Yuichi Aoki, Manabu Okamoto (Espec Corp.), Atsushi Masuda, Takuya Doi (AIST) R2010-33
Abstract (in Japanese) (See Japanese page) 
(in English) To clarify the failure-mode of crystalline-silicon photovoltaic modules on the thermal-cycle test, the modules were exposed under the dry thermal-stress with rapid thermal-cycling. Pmax was drastically decreased with this treatment, and the increasing of impedance depending on the cycle number was observed at high temperature period, using the on-line monitoring of conductor resistance. In addition, the defection at the particular areas of a module was confirmed by the infrared, EL, and Jsc imaging. These results indicate that the interconnector and/or solder-joint failure occurred during this rapid thermal-cycling, and anticipate that this procedure would be a novel acceleration method for the detection of these failures.
Keyword (in Japanese) (See Japanese page) 
(in English) Photovoltaic Module / Reliability / Thermal-Cycling / Solder / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 298, R2010-33, pp. 5-8, Nov. 2010.
Paper # R2010-33 
Date of Issue 2010-11-12 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee R  
Conference Date 2010-11-19 - 2010-11-19 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
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Paper Information
Registration To R 
Conference Code 2010-11-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Performance Degradation of Photovoltaic Modules with Rapid Thermal-Cycling 
Sub Title (in English)  
Keyword(1) Photovoltaic Module  
Keyword(2) Reliability  
Keyword(3) Thermal-Cycling  
Keyword(4) Solder  
1st Author's Name Yuichi Aoki  
1st Author's Affiliation Espec Corp. (Espec Corp.)
2nd Author's Name Manabu Okamoto  
2nd Author's Affiliation Espec Corp. (Espec Corp.)
3rd Author's Name Atsushi Masuda  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Takuya Doi  
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
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Speaker Author-1 
Date Time 2010-11-19 14:25:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2010-33 
Volume (vol) vol.110 
Number (no) no.298 
Page pp.5-8 
Date of Issue 2010-11-12 (R) 

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