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| Presentation | 2010-11-19 14:25 Performance Degradation of Photovoltaic Modules with Rapid Thermal-Cycling Yuichi Aoki, Manabu Okamoto (Espec Corp.), Atsushi Masuda, Takuya Doi (AIST)  R2010-33 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | To clarify the failure-mode of crystalline-silicon photovoltaic modules on the thermal-cycle test, the modules were exposed under the dry thermal-stress with rapid thermal-cycling. Pmax was drastically decreased with this treatment, and the increasing of impedance depending on the cycle number was observed at high temperature period, using the on-line monitoring of conductor resistance. In addition, the defection at the particular areas of a module was confirmed by the infrared, EL, and Jsc imaging. These results indicate that the interconnector and/or solder-joint failure occurred during this rapid thermal-cycling, and anticipate that this procedure would be a novel acceleration method for the detection of these failures. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Photovoltaic Module / Reliability / Thermal-Cycling / Solder / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 298, R2010-33, pp. 5-8, Nov. 2010. | |
| Paper # | R2010-33 | |
| Date of Issue | 2010-11-12 (R) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | R2010-33 |
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| Conference Information | |
| Committee | R |
| Conference Date | 2010-11-19 - 2010-11-19 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | R |
| Conference Code | 2010-11-R |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Performance Degradation of Photovoltaic Modules with Rapid Thermal-Cycling |
| Sub Title (in English) | |
| Keyword(1) | Photovoltaic Module |
| Keyword(2) | Reliability |
| Keyword(3) | Thermal-Cycling |
| Keyword(4) | Solder |
| Keyword(5) | |
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| Keyword(8) | |
| 1st Author's Name | Yuichi Aoki |
| 1st Author's Affiliation | Espec Corp. (Espec Corp.) |
| 2nd Author's Name | Manabu Okamoto |
| 2nd Author's Affiliation | Espec Corp. (Espec Corp.) |
| 3rd Author's Name | Atsushi Masuda |
| 3rd Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 4th Author's Name | Takuya Doi |
| 4th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
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| Speaker | Author-1 |
| Date Time | 2010-11-19 14:25:00 |
| Presentation Time | 25 minutes |
| Registration for | R |
| Paper # | R2010-33 |
| Volume (vol) | vol.110 |
| Number (no) | no.298 |
| Page | pp.5-8 |
| #Pages | 4 |
| Date of Issue | 2010-11-12 (R) |
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